Method for simulating photon scattering by using quasi Monte Carlo method

A quasi-Monte Carlo and photon technology, which is used in instruments for radiological diagnosis, material analysis using wave/particle radiation, and applications. It can solve the problem of long calculation time for scattered photons, and achieve shortened calculation time and high accuracy. Effect

Active Publication Date: 2021-05-07
TSINGHUA UNIV +1
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these photon scattering simulation methods all have the problem that the calculation time of scattered photons is too long

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for simulating photon scattering by using quasi Monte Carlo method
  • Method for simulating photon scattering by using quasi Monte Carlo method
  • Method for simulating photon scattering by using quasi Monte Carlo method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0060] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0061] Embodiments of the present invention provide a method for simulating photon scattering with a pseudo-Monte Carlo method, which is applied to such as figure 1 Shown in the scattered photon simulation model.

[0062] figure 1 A simulation model of scattered photons including a light source S, a phantom M and a detector D is shown. figure 1 The geometric model of the photonic imaging system shown includes a light source S, a phantom M and a detector D. figure 1 The geometric representation of the third-order scattering is also exemplarily given in . The photon passes through the motif M and undergoes third-order scattering, A 1 ,A 2 ,A 3 represent the 1st, 2nd, and 3rd order interaction points, respectively. A photon arrives at each interaction A i , after i=1, 2, 3, the direction will change, and pass through the motif M with a certain pr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for simulating photon scattering by using a quasi Monte Carlo method, which is applied to a system comprising a light source S, a motif M and a detector D. Photons are preset to be emitted from the light source S, initially enter the motif M at an intersection point A0, and are subjected to i-order scattering at an interaction point Ai, (i = 1,..., n), and the method tracks distribution of the photons reaching the measured motif M from the light source S. The scattering path of photons in the motif M is simulated, and detector pixels corresponding to interaction points are forcibly selected, so that the simulation of the photon scattering process is realized, and by adopting the method, the precision of photon scattering simulation is high, and the calculation time of scattered photons is shortened.

Description

technical field [0001] The invention relates to the field of scattered photon simulation, in particular to a method for simulating photon scattering with a pseudo-Monte Carlo method. Background technique [0002] Cone-beam computed tomography (CBCT) has been widely used in clinical medicine, industry, security inspection and other fields. However, photons passing through the measured object will produce scattering, and both the scattered signal and the non-scattered signal (useful signal) will be collected by the detector, so that the scattered signal will affect the useful signal, especially when using flat panel detectors and high-energy X-rays When collecting. This is one of the main challenges in obtaining high-quality CBCT images. If the photon scattering problem is not considered, the contrast resolution of the reconstructed image will be reduced, and cupping artifacts, shadows, streaks and inhomogeneity will be generated, which will greatly affect the accuracy of th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/046A61B6/00
CPCG01N23/046A61B6/5258
Inventor 林桂元邓世沃王小群
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap