FPGA chip test method, device and system and storage medium

Abstract

The embodiment of the invention is suitable for the technical field of chip testing, and provides an FPGA chip testing method, device and system and a computer readable storage medium. The method comprises the steps that configuration data are sent to a configuration chip according to a test item, so that the configuration chip burns the configuration data into a tested FPGA chip, and the configuration chip is arranged on automatic test equipment; and the test excitation data is sent to the automatic test equipment, and a test response result from the automatic test equipment is received. Through the configuration chip arranged on the automatic test equipment, the configuration data is sent to the tested FPGA chip according to the test item, the problem that the existing automatic test equipment does not have a chip configuration function is solved, an FPGA chip test board does not need to be manufactured, the configuration information can be sent to the tested FPGA chip through test software at any time, repeated power-on and power-off plugging of the test board is not needed, a large amount of configuration time is saved for FPGA chip testing, and the test efficiency is improved.

Description

technical field [0001] The present application belongs to the technical field of chip testing, and in particular relates to an FPGA chip testing method, device, system and computer-readable storage medium. Background technique [0002] With the gradual wide application of FPGA devices in production and life, the development of process technology of FPGA devices has received more and more attention from the country. As an essential part of FPGA chip R&D and production, FPGA testing technology also needs continuous improvement to meet the testing requirements of rapidly developing FPGA chips. [0003] FPGA is a non-functional device in advance, which only includes a large number of repetitive IOBs (input and output modules), CLBs (configurable logic blocks) and wiring channels and other uncomplicated basic units. At present, automatic test equipment (ATE) is mainly used to test FPGA. However, the number of FPGA pins ranges from hundreds to thousands. Every time the FPGA is c...

AI Technical Summary

Problems solved by technology

As the scale of the FPGA increases, the number of FPGA configurations will increase exponentially, and the traversal test of the internal resources of the FPGA will also be extremely time-consuming. Although it can be achieved in theory, it is difficult to apply it in production.

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