Optical device test circuit
A technology for testing circuits and optical devices, which is applied in the field of optical communication and can solve problems such as low test efficiency of optical devices
Active Publication Date: 2022-03-08
深圳市力子光电科技有限公司
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[0003] This application provides an optical device testing circuit to solve the problem of low test efficiency of existing optical devices
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[0038] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, but not all of them. Based on the embodiments in the present application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present application.
[0039] see figure 1 , figure 1 It is one of the structural schematic diagrams of the optical device testing circuit provided in the embodiment of the present application. Such as figure 1 As shown, the optical device test circuit includes: a universal serial bus USB interface unit 100, a control unit 200, a current test unit 300, an ...
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The present application relates to an optical device test circuit, which includes: a universal serial bus USB interface unit, a control unit, a current test unit, an optical power test unit, a first drive unit, and a first optical device interface unit; wherein , the first drive unit is respectively connected to the control unit and the first optical device interface unit; the current test unit and the optical power test unit are both connected to the first optical device interface unit; the current test unit is used to obtain the current parameter corresponding to the optical device to be tested Voltage signal; the optical power test unit is used to obtain the voltage signal corresponding to the optical power value of the optical device to be tested; the USB interface unit, the current test unit and the optical power test unit are all connected to the control unit. In this way, the voltage signal corresponding to the current parameter and the voltage signal corresponding to the optical power value can be obtained simultaneously by the control unit, and the current parameter and the optical power value of the optical device to be tested can be tested simultaneously, thereby improving the testing efficiency of the optical device.
Description
technical field [0001] The present application relates to the technical field of optical communication, in particular to an optical device testing circuit. Background technique [0002] At present, the prospect of the optical communication market is relatively good, the demand for optical devices in the market is very large, and the output of optical devices of optical device manufacturers is also very large. In the production process of optical devices, various indicators of optical devices need to be tested, and only when all indicators pass the test can they enter the market. Existing optical device testing methods need to use various testing instruments to test various indicators of the optical device respectively, which makes the testing efficiency of the optical device low. Contents of the invention [0003] The present application provides an optical device testing circuit to solve the problem of low testing efficiency of existing optical devices. [0004] In a fi...
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IPC IPC(8): G01R31/00G01R19/00G01M11/02
CPCG01R31/00G01R19/00G01M11/02
Inventor 金海亮王四俊熊福胜张向辉伍林具佶勋
Owner 深圳市力子光电科技有限公司