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A dynamic and static integrated test device and test method for a half-bridge power module

A technology of half-bridge power modules and power modules, which is applied in the direction of measuring devices, measuring electricity, and measuring electrical variables, etc., can solve problems such as complex operation process, influence of data consistency, and increased cost of test equipment, so as to simplify test steps and reduce Cost, the effect of improving test efficiency

Active Publication Date: 2022-03-04
GUANGDONG POWER GRID CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In the existing test methods for half-bridge power modules, the static test and the dynamic test cannot be completed at the same time, and two sets of independent topologies are required to complete the dynamic and static test, which will not only further increase the cost of the test equipment, but also make the operation process easier It is complicated and has a certain impact on data consistency

Method used

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  • A dynamic and static integrated test device and test method for a half-bridge power module
  • A dynamic and static integrated test device and test method for a half-bridge power module
  • A dynamic and static integrated test device and test method for a half-bridge power module

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Embodiment Construction

[0037] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0038] It should be understood that the step numbers used herein are only for convenience of description, and are not intended to limit the order in which the steps are executed.

[0039] It should be understood that the terminology used in the description of the present invention is for the purpose of describing particular embodiments only and is not intended to limit the present invention. As used in this specification and the appended claims, the singular forms ...

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Abstract

The invention discloses a dynamic and static integrated test device and a test method for a half-bridge power module, and relates to the technical field of power electronics. The half-bridge power module dynamic and static integrated test device includes a half-bridge power module, a capacitor module and an inductance module; the half-bridge power module includes an upper insulated gate bipolar transistor and a lower insulated gate bipolar transistor connected in series; the The capacitance module includes several capacitors connected in series; the inductance module includes a first inductor and a second inductor connected in series, the first inductor is connected in parallel with the upper insulated gate bipolar transistor, and the second inductor is connected with the upper insulated gate bipolar transistor. The lower insulated gate bipolar transistors are connected in parallel; the half-bridge power module is connected in parallel with the capacitor module. The invention can carry out dynamic and static tests on the half-bridge power module at the same time, simplifies the test process and reduces the test cost.

Description

technical field [0001] The invention relates to the technical field of power electronics, in particular to a dynamic and static integrated test device for a half-bridge power module and a test method thereof. Background technique [0002] In a three-phase full-bridge circuit, the two transistors in a half-bridge power module are never turned on or off at the same time. Combined with the application scenario of the half-bridge power module, the application scenario of the half-bridge power module cannot be judged based on the condition that both transistors are all on or all off. [0003] In the existing test methods for half-bridge power modules, the static test and the dynamic test cannot be completed at the same time, and two sets of independent topologies are required to complete the dynamic and static test, which will not only further increase the cost of the test equipment, but also make the operation process easier It is complex and has a certain impact on data consis...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 岳菁鹏马凯肖祥赵伟金莉雷二涛
Owner GUANGDONG POWER GRID CO LTD