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A detection structure and detection method

A detection structure and detection method technology, applied in semiconductor/solid-state device testing/measurement, electrical components, circuits, etc., can solve the problem that the display backplane cannot be detected

Active Publication Date: 2022-05-31
KONKA GROUP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of the above deficiencies in the prior art, the purpose of this application is to provide a detection structure and detection method, aiming to solve the problem that the display backplane cannot be detected before mass transfer

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  • A detection structure and detection method
  • A detection structure and detection method
  • A detection structure and detection method

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Embodiment Construction

[0050] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the related drawings. in the attached drawing

[0052] As shown in FIG. 1, the Micro-LED display backplane 100 includes several pixel areas 110, each pixel area 110

[0053] At present, the detection method of the dead pixel on the display backplane 100 is generally to light up the LED chip after the massive transfer, and pass the detection method.

[0055] As shown in Figure 3 to Figure 15, the present invention provides a detection structure, the detection structure is used to detect the display backplane

[0057] Please refer to FIG. 4 to FIG. 6, in one embodiment, the display backplane 100 includes a substrate 103, a circuit layer 104 and

[0058] The planarization layer 105 covers the circuit layer 104, the first contact electrode 101 and the second contact

[0059] Wherein, the substrate 103 may include a transparent glass mater...

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Abstract

The invention relates to a detection structure and a detection method. The method comprises the steps of: providing a display backplane, a detection circuit board and a detection light-emitting diode chip; placing the detection circuit board on the display backplane, so that the first detection circuit board The detection line is connected to the first contact electrode, and the second detection line on the detection circuit board is connected to the second contact electrode; the drive signal is output to the first detection line and the second detection line through the display backplane. If the diode chip is not lit, the detection of the light-emitting diode chip corresponds to the abnormality of the contact electrode pair on the display backplane. The invention can detect possible defects on the display backplane before mass transfer, and can detect whether there is damage on the display backplane.

Description

A detection structure and detection method technical field [0001] The present invention relates to the technical field of display, in particular to a detection structure and a detection method. Background technique [0002] Micro-light-emitting diode (Micro Light-Emitting Diode, Micro-LED) display, with good The advantages of stability, life and operating temperature, but also inherit the low power consumption, color saturation, fast response speed, It has the advantages of strong contrast and so on, and has great application prospects. The miniature light-emitting diode display backplane includes several pixel areas, Each pixel area includes red LEDs, blue LEDs, and green LEDs. In the production process of the display, three kinds of red, green and blue need to be combined. The LED chips are transferred from the respective growth substrate (WAFER) to the display backplane. However, if either LED chip appears damaged / In the case of poor contact, after transfer, a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66
CPCH01L22/34H01L22/12
Inventor 王广孔琴林建宏
Owner KONKA GROUP
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