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Test case generation device, test case generation method, and test case generation program

A test case generation and test case technology, applied in software testing/debugging, error detection/correction, instrumentation, etc., can solve problems such as increased man-hours, complicated source code of embedded real-time software, etc., to achieve the effect of reducing time

Pending Publication Date: 2021-10-29
MITSUBISHI ELECTRIC CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In recent years, the source code of embedded real-time software has become large-scale and complex
Therefore, the increase in man-hours for manually generating test cases involving multiple steps that satisfy the required specifications of the software and include source code construction becomes a problem

Method used

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  • Test case generation device, test case generation method, and test case generation program
  • Test case generation device, test case generation method, and test case generation program
  • Test case generation device, test case generation method, and test case generation program

Examples

Experimental program
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Embodiment approach 1

[0039] ***Description of structure***

[0040] refer to figure 1 , the configuration of the test case generation device 100 of this embodiment will be described.

[0041] The test case generating device 100 is a computer. The test case generation device 100 has a processor 910 and other hardware such as a memory 920 and an input / output device 930 . The processor 910 is connected to other hardware via signal lines, and controls the other hardware.

[0042] The test case generation device 100 has a program acquisition unit 110 , an included portion extraction unit 120 , a generation control unit 130 , a function generation unit 140 , a non-symbol generation unit 150 , and a symbol generation unit 160 as functional elements. In addition, the non-sign generation unit 150 and the sign generation unit 160 are also referred to as a test generation unit 170 . Each functional element is realized by software.

[0043] The processor 910 is means for executing a test case generation ...

test Embodiment 50

[0121] The non-symbolic generation unit 150 randomly generates the test case candidate in the second step as a value 50 by non-symbolic execution (step S6). The non-sign generation unit 150 uses the test case 50 of the first step, sets the value of the first step of the input variable sigA to 50, and connects the value 50 of the test case candidate of the second step to the test case candidate of the second step (50 , 50).

[0122] The function generation part 140 generates the function for test case generation which uses the test case candidate (50, 50) as input of sigA and executes the program of the test object software of 2 steps (step S7).

[0123] The non-symbol generating unit 150 executes while holding the state between steps so that the state is held when the execution of one step is completed using the function for test case generation and the second step is executed. Then, the non-sign generation unit 150 checks whether or not the non-included inclusion sites P2 to...

Deformed example 1

[0157] In this embodiment, the functions of the program acquisition unit 110 , the inclusion site extraction unit 120 , the generation control unit 130 , the function generation unit 140 , the non-symbol generation unit 150 , and the symbol generation unit 160 are realized by software. As a modified example, the functions of the program acquisition unit 110 , the inclusion part extraction unit 120 , the generation control unit 130 , the function generation unit 140 , the non-sign generation unit 150 and the symbol generation unit 160 may also be realized by hardware.

[0158] Figure 11 It is a configuration diagram of the test case generation device 100 according to the modified example of the present embodiment.

[0159] The test case generation device 100 has hardware such as an electronic circuit 909 , a memory 920 , and an input / output device 930 .

[0160] The electronic circuit 909 is a dedicated electronic circuit that realizes the functions of the program acquisition...

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Abstract

In the present invention, if an (i-1)-th test case, which is a test case from a step 1 to a step (i-1), is stored, a generation control unit (130) uses the (i-1)-th test case to select a first generation scheme (M1) for generating an i-th test case, which is a test case from the step 1 to a step (i). A test generation unit (170) generates, in accordance with the first generation scheme (M1), a test case for executing the i-th step in a state where the internal state, existing at the end of the step (i-1) due to execution of the (i-1)-th test case, is maintained. The test generation unit (170) generates the i-th test case by joining the (i-1)-th test case and the test case of the i-th step.

Description

technical field [0001] The invention relates to a test case generation device, a test case generation method and a test case generation program. In particular, it relates to a test case generation device, a test case generation method and a test case generation program for automatically generating test cases of embedded software. Background technique [0002] Control devices such as automobiles and industrial robots are equipped with embedded real-time software for various controls. If such software malfunctions, life-threatening accidents will result. Therefore, it is necessary to carry out sufficient testing before shipment. For example, ISO26262, the functional safety standard for automobiles, and DO-178C, the functional safety standard for aircraft, require test requirements such as determination of the test method to be adopted for each test process, and conduct tests according to these test requirements. As an example of the test requirements of the unit test, test ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/36G06F11/3684G06F11/3688G06F11/3676G06F11/3692
Inventor 马场円
Owner MITSUBISHI ELECTRIC CORP
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