The invention relates to the field of task
queue scheduling of automobile chips, in particular to a
test case dynamic priority scheduling method for automobile electronic chips. Comprising the following steps: analyzing
standard test data of the automobile
electronic chip, and organizing a structured
data set associated with the physical
layout of the
chip; identifying failure clusters and
noise points on the structured
data set by using a data clustering
algorithm; extracting geometric and position features of the failure cluster, classifying the failure cluster into a known failure mode by using a classifier, performing
correlation analysis on the failure mode, an upstream key process step and an equipment log, and establishing a causal relationship; calculating a function security risk
score for each
chip; and when the function security risk
score is higher than a preset
risk threshold value, generating and executing a dynamic task rearrangement instruction, and dynamically improving the execution priority of the
test case. According to the method, the priority is dynamically selected according to the function security risk
score through the dynamic task rearrangement instruction, so that the test time is saved, and the coverage depth and quality of the test are improved.