Bad element identification method and related device
A bad element identification method and related device technology, applied in the field of image recognition, can solve the problems of increasing the delay of bad element identification, reducing the efficiency of bad element identification, etc., and achieve the effect of reducing the amount of calculation and improving efficiency
Active Publication Date: 2021-11-23
SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD
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[0047] The core of the present application is to provide a bad element identification method, a bad element identification device, a computing device, and a computer-readable storage medium, which reduce the calculation amount of bad element identification and improve identification efficiency.
[0048] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0049] In related technologies, the template matching m...
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The invention discloses a bad element identification method, which comprises the following steps: carrying out image acquisition on a to-be-detected sample through high-resolution image acquisition equipment to obtain an image of the to-be-detected sample; decomposing the image of the sample to be tested by adopting Haar wavelet transform to obtain a low-frequency component; and carrying out bad element identification on the low-frequency component by adopting a multi-stage template to obtain an identification result. The low-frequency component is obtained by decomposing the collected to-be-detected sample image, and the recognition result is obtained by performing bad element recognition on the low-frequency component by adopting the multi-stage template, so that bad element recognition can be performed as the basic features of the original image are reserved in the low-frequency component, and meanwhile, the calculation amount of recognition is reduced, and the bad element identification efficiency is improved. The invention further discloses a bad element identification device, computing equipment and a computer readable storage medium, which have the above beneficial effects.
Description
technical field [0001] The present application relates to the technical field of image recognition, and in particular to a method for identifying bad elements, a device for identifying bad elements, a computing device, and a computer-readable storage medium. Background technique [0002] The manufacturing process of high-scale array devices is relatively complicated, and bad elements are common. A damaged pixel will directly affect the performance of the pixel, thereby affecting the imaging quality of the entire device. Therefore, it is necessary to accurately identify bad elements and find damaged pixels in time. [0003] In related technologies, the template matching method is generally used to collect sample images through a high-resolution camera, and then compare with standard template patterns to identify defect positions, which is widely used in defect inspection of some complex patterns. However, the number of pixels in high-array-scale devices often reaches millio...
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IPC IPC(8): G06K9/32G06K9/62G06N3/04G06N3/08
CPCG06N3/08G06N3/045G06F18/241Y02P90/30
Inventor 周朗
Owner SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD