NAND test analysis method and device based on solid state disk and computer equipment

A test analysis, solid-state drive technology, applied in static memory, instruments, etc., can solve problems such as reducing test efficiency, affecting product analysis efficiency and progress, lack of NAND particle VTH visual analysis tools, etc., to achieve the effect of improving analysis efficiency

Pending Publication Date: 2021-12-03
SHENZHEN YILIAN INFORMATION SYST CO LTD
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Problems solved by technology

However, in the existing NAND test and analysis process, there is a lack of visual analysis tools for the VTH of NAND particles, and it is impossible for testers to intuitively grasp the VTH test results, which affects the analysis efficiency and progress of the product and reduces the test efficiency.

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  • NAND test analysis method and device based on solid state disk and computer equipment
  • NAND test analysis method and device based on solid state disk and computer equipment
  • NAND test analysis method and device based on solid state disk and computer equipment

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[0046] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0047] At present, in the SSD test system, the judgment voltage of NAND particles will directly affect the validity of data storage. However, in the existing NAND test and analysis process, there is a lack of visual analysis tools for the VTH (threshold voltage) of NAND particles, and it is impossible for testers to intuitively grasp the VTH test results, which affects the analysis efficiency and progress of the product and reduces the test efficiency.

[0048] Based on this, the present invention provides a kind of NAND test analysis method based on solid-state hard disk,...

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Abstract

The invention relates to an NAND test analysis method and device based on a solid state disk, computer equipment and a storage medium, and the method comprises the steps: building a test environment, and connecting a to-be-tested disk loading tool plate to a host through a serial port; obtaining an NAND test analysis request based on the solid state disk; initializing a test environment according to the test analysis request, setting serial port equipment number and a baud rate through a test interface, opening a serial port, and loading Debug firmware through the serial port; after loading of the Debug firmware is completed, selecting the physical position of the to-be-tested NAND by an operation interface, and starting to execute NAND VTH scanning testing; and after the VTH scanning test is finished, outputting a VTH scanning test result, meanwhile, outputting a scanned VTH visual judgment graph, and comparing the scanned VTH visual judgment graph with a preset standard value for drawing. The VTH visual operation of the NAND particles of the solid state disk is realized, and the VTH test efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of hard disk testing, in particular to a solid-state hard disk-based NAND testing and analysis method, device, computer equipment and storage medium. Background technique [0002] With the development of computer technology, computer equipment has become the most productive and practical tool for people today, and the safety and stability of computer equipment is a necessary guarantee for people to work with computers. Today, solid-state drives are more and more widely used because of their fast read and write, light weight, low energy consumption, and small size. Solid-state hard drives are one of the core hardware devices in computer equipment, and their stability and reliability greatly affect the security and stability of the entire computer equipment. Therefore, before the computer equipment leaves the factory, it is necessary to test the solid-state hard disk in the computer equipment. [0003] At pre...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
CPCG11C29/56G11C2029/5602G11C2029/5604
Inventor 彭李乔赵军委贾宗铭
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD
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