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Slice focus map acquisition method and device, computer equipment and storage medium

An acquisition method and slicing technology, applied in the field of artificial intelligence, can solve problems such as low efficiency, long pre-scanning time, and reduced focus map accuracy, and achieve the effect of efficient acquisition and time saving.

Pending Publication Date: 2021-12-21
TENCENT TECH (SHENZHEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, since the digital slice scanner needs to perform axial step scanning and collect multiple slice scanning images for each sampling point during the pre-scanning process, the pre-scanning takes a long time and the efficiency is low; but if the number of sampling points is reduced number, it will reduce the accuracy of the focus map

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  • Slice focus map acquisition method and device, computer equipment and storage medium
  • Slice focus map acquisition method and device, computer equipment and storage medium
  • Slice focus map acquisition method and device, computer equipment and storage medium

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Embodiment Construction

[0032] In order to make the purpose, technical solution and advantages of the present application clearer, the implementation manners of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0033] When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present application as recited in the appended claims.

[0034] In the description of the present application, it should be understood that the terms "first", "second" and so on are used for descriptive purposes only, and should not be understood as indicating or implying relative importance. In the description of this appli...

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Abstract

The invention discloses a slice focus map acquisition method and device, computer equipment and a storage medium, and relates to the technical field of artificial intelligence. The method comprises the following steps: acquiring a slice scanning image of a target sampling point of a slice through a digital slice scanner; performing out-of-focus information prediction based on the image content of the slice scanning image to obtain out-of-focus information of the slice scanning image, wherein the out-of-focus information is used for indicating the deviation degree between the axial position of the target sampling point and the focal plane position of the target sampling point; calculating a focal plane position of the target sampling point according to the out-of-focus information; and generating the focus map based on the focal plane position of the target sampling point. The focus map of the slice can be quickly generated in the pre-scanning process of the slice by the digital slice scanner, and the precision of the focus map is relatively high.

Description

technical field [0001] The present application relates to the technical field of artificial intelligence, and in particular to a sliced ​​focus map acquisition method, device, computer equipment and storage medium. Background technique [0002] The digital slice scanner converts traditional physical slices into whole slice digital images (WholeSlideImages, WSI), which makes the storage of slices more convenient, and the slices can be analyzed later by artificial intelligence-related technologies. In the process of converting slices into digital images, in order to eliminate the focus error during scanning caused by the ups and downs of the slice itself, the digital slice scanner will obtain the images of multiple sampling points on the slice through pre-scanning before formally scanning the slice. Focus position, that is, the focus map (FocusMap) of the slice. [0003] In the related art, in order to obtain the focus map of the slice, each sampling point on the slice is sca...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G16H30/20G16H70/60G06K9/62G06N3/04G06N3/08
CPCG16H30/20G16H70/60G06N3/04G06N3/084G06F18/214
Inventor 廖俊姚建华丁戈
Owner TENCENT TECH (SHENZHEN) CO LTD