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Integrated circuit test interface equipment

A technology for testing interfaces and integrated circuits, which is applied in the field of integrated circuit testing interface equipment, can solve problems such as poor sealing effect, reduced conduction connection effect between conversion joints and interface equipment, and easy entry of dust, so as to avoid loosening and dust entering Inside the conduction groove, the effect of ensuring conduction and connectivity

Inactive Publication Date: 2021-12-31
谢俊娅
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the process of testing the integrated circuit, it is necessary to connect the integrated circuit and the test equipment through the line. When the line is connected, the interface device is generally used as a conversion to facilitate the connection between different integrated circuits and the test equipment. However, When connecting different integrated circuits, the conversion joints on the interface equipment need to be frequently connected and disconnected. Under frequent work, the interface equipment and the conversion joints are prone to loosening, which will cause the interface equipment and conversion joints The conduction effect between the connectors is reduced. At the same time, when the test is not performed, the conversion connector needs to be removed from the interface device. After the removal, the conduction point on the interface device is exposed to the air, and its own sealing effect is poor. , causing dust in the air to easily enter the conduction point, resulting in a decrease in the conduction connection effect between the next conversion joint and the interface device

Method used

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  • Integrated circuit test interface equipment
  • Integrated circuit test interface equipment
  • Integrated circuit test interface equipment

Examples

Experimental program
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Embodiment 1

[0022] as attached figure 1 to attach Figure 5 Shown:

[0023] The present invention is an integrated circuit test interface device, which comprises a tester 1, a data display 2, an interface device 3, and a button 4. The front surface of the tester 1 is embedded with a data display 2, and the tester 1 is fixed under the front end. An interface device 3 is installed, and the button 4 is arranged on the upper end surface of the interface device 3. The interface device 3 includes an interface base 31, a conversion joint 32, a conduction mechanism 33, and a wire 34. The interface base 31 is located on the tester 1 Below the front end, and inside the upper end of the interface base 31 is provided with a conversion joint 32, the bottom of the conversion joint 32 is engaged with the upper end of the conduction mechanism 33, and the bottom of the conduction mechanism 33 is provided with a wire 34, and the wire 34 is connected to the tester 1 Electrically connected, the conduction ...

Embodiment 2

[0030] as attached Image 6 to attach Figure 7 Shown:

[0031] Wherein, the conduction mechanism 33 includes an opening and closing mechanism 331, a contraction plate 332, a block 333, and a conduction piece 334. The top of the closing mechanism 331, the block 333 is located at the middle end of the top of the opening and closing mechanism 331, the bottom of the conductive piece 334 is welded with the wire 34, the shrinking plate 332 is in a folded structure, and is made of rubber, with a certain Resilience improves the tightness of the extrusion connection between the top of the conduction mechanism 33 and the conversion joint 32 .

[0032]Wherein, the opening and closing mechanism 331 includes a connecting seat 31a, a conduction groove 31b, an opening and closing piece 31c, and a torsion shaft 31d, the lower end of the connecting seat 31a is fixed to the upper end surface of the conducting piece 334, and the conducting groove 31b is embedded in the connection Inside the ...

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PUM

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Abstract

The invention discloses an integrated circuit test interface device. The device structurally comprises a tester, a data display, an interface device and a button. The data display is fixedly embedded in the front surface of the tester, the interface device is fixedly installed below the front end of the tester, after a conversion joint is inserted, a rotating rod is loosened, and an elastic force is applied through the interior of a spring pipe sleeve, so that a clamping piece elastically moves towards the inner side to abut against the upper end of the outer side of the conduction mechanism, and an abutting piece firmly extrudes an external connecting wire, so that the connecting wire is firmly clamped in an embedding groove, and loosening between the external wire and the embedding groove is avoided. Through extruding the shrinkage plate through the lower end of the adapter, the extrusion connection clamping sealing performance between the top of the conduction mechanism and the conversion connector is improved, through the torsion elasticity of the torsion shaft, the opening and closing piece automatically resets, the upper end of the conduction groove is closed and sealed, dust is prevented from entering the conduction groove, and the conduction connectivity of the interior of the conduction groove is ensured.

Description

technical field [0001] The present invention relates to the technical field of integrated circuit testing, and more specifically, relates to an integrated circuit testing interface device. Background technique [0002] In the process of testing the integrated circuit, it is necessary to connect the integrated circuit and the test equipment through the line. When the line is connected, the interface device is generally used as a conversion to facilitate the connection between different integrated circuits and the test equipment. However, When connecting different integrated circuits, the conversion joints on the interface equipment need to be frequently connected and disconnected. Under frequent work, the interface equipment and the conversion joints are prone to loosening, which will cause the interface equipment and conversion joints The conduction effect between the connectors is reduced. At the same time, when the test is not performed, the conversion connector needs to b...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2808
Inventor 谢俊娅
Owner 谢俊娅