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Task delay determination method, device and system and related equipment

A technology for determining methods and tasks, applied in the field of chip design and testing

Pending Publication Date: 2021-12-31
HYGON INFORMATION TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, the evaluation based on the signal delay of the actual circuit of the chip can only reflect the limited operating characteristics of the chip that can be tested during the test phase. How to determine the operating characteristics of each module in the chip is an urgent need for those skilled in the art to solve technical issues

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  • Task delay determination method, device and system and related equipment
  • Task delay determination method, device and system and related equipment
  • Task delay determination method, device and system and related equipment

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Embodiment Construction

[0052] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0053] As described in the background technology, the evaluation based on the signal delay of the actual circuit of the chip reflects the limited operating characteristics of the chip that can be tested during the test phase. How to determine the operating characteristics of each module in the chip is a technology in the art. Technical problems that personnel need to solve urgently.

[0054]The inventor believes that during the operation of the chip, the modules are used to perform ...

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Abstract

The embodiment of the invention provides a task delay determination method, device and system and related equipment, and the method comprises the steps: obtaining the total task request amount and the total task delay amount of a target type task in a plurality of tasks needing to be executed by a to-be-tested module in a preset number of clock cycles; and based on the total task request amount and the total task delay amount of the target type task, determining the task average delay of the target type task, further reflecting the performance level of the module from the angle of the task delay, and determining the operation characteristics of each module in the chip.

Description

technical field [0001] The embodiments of the present application relate to the technical field of chip design and testing, and in particular to a task delay determination method, device, system and related equipment. Background technique [0002] During the design and testing process of the chip, it is necessary to evaluate the performance of the chip. The delay parameter of the chip is an important parameter reflecting the performance of the chip, which can reflect the operating characteristics of the chip and the characteristics of the internal interconnection structure of the chip, and then the internal structure of the chip can be adjusted based on the delay parameter. In the prior art, the evaluation is usually based on the signal delay of the actual circuit of the chip, for example, the test is performed based on the signal transmission delay of various circuits in the FPGA circuit chip, so that the design of the chip circuit or the adjustment of the chip circuit stru...

Claims

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Application Information

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IPC IPC(8): G06F11/22G01R31/3183
CPCG06F11/2205G06F11/2273G01R31/318328
Inventor 李凯薛妙莹潘于
Owner HYGON INFORMATION TECH CO LTD