Neural network testing method and device, computer equipment and storage medium
A neural network and testing method technology, applied in the neural network testing method, computer equipment and storage medium, and device fields, can solve the problems of long time and low efficiency.
Pending Publication Date: 2022-01-04
上海阡视科技有限公司
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Problems solved by technology
Before deploying the trained deep learning network to embedded devices, the parameters of the deep learning network need to be further adjusted; the current adjustment method has the problems of long time consumption and low efficiency
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[0027]In order to make the purpose, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present disclosure. Obviously, the described embodiments are only It is a part of the embodiments of the present disclosure, but not all of them. The components of the disclosed embodiments generally described and illustrated herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the present disclosure is not intended to limit the scope of the claimed disclosure, but merely represents selected embodiments of the present disclosure. Based on the embodiments of the present disclosure, all other embodiments obtained by those skilled in the art without creative effort shall fall wit...
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The invention provides a neural network testing method and device, computer equipment and a storage medium. The method comprises the steps of obtaining a to-be-deployed neural network, and a standard network corresponding to the to-be-deployed neural network; in a hardware environment of the to-be-deployed neural network, processing first verification data by using the to-be-deployed neural network to obtain first result data corresponding to each network layer of the to-be-deployed neural network; in a test environment, processing the first verification data by using the standard network to obtain second result data corresponding to each network layer; and determining a target network layer from the to-be-deployed neural network based on the first result data and the second result data. Therefore, by determining the target network layer, the parameters of the target network layer can be adjusted in a targeted manner, so that the time consumed for adjusting the parameters of the neural network to be deployed is reduced, and the adjustment efficiency is improved.
Description
technical field [0001] The present disclosure relates to the technical field of neural networks, in particular, to a neural network testing method, device, computer equipment and storage medium. Background technique [0002] With the development of artificial intelligence, deep learning networks are gradually being applied in production and life practice. Before deploying the trained deep learning network to the embedded device, the parameters of the deep learning network need to be further adjusted; the current adjustment method has the problems of time-consuming and low efficiency. Contents of the invention [0003] Embodiments of the present disclosure at least provide a neural network testing method, device, computer equipment, and storage medium. [0004] In the first aspect, an embodiment of the present disclosure provides a method for testing a neural network, including: obtaining a neural network to be deployed and a standard network corresponding to the neural ne...
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IPC IPC(8): G06N3/08G06N3/04
CPCG06N3/08G06N3/044G06N3/045
Inventor 荆森边旭胡延隆
Owner 上海阡视科技有限公司