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Test method, test device, computer equipment and computer readable storage medium

A test method and test environment technology, applied in the detection of faulty computer hardware, computing, energy-saving computing, etc., can solve problems such as TDP deviation

Active Publication Date: 2022-01-07
PHYTIUM TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a certain deviation in the obtained TDP

Method used

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  • Test method, test device, computer equipment and computer readable storage medium
  • Test method, test device, computer equipment and computer readable storage medium
  • Test method, test device, computer equipment and computer readable storage medium

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Embodiment Construction

[0050]The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all of them. The components of the embodiments of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of the present application.

[0051] It should b...

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Abstract

The invention belongs to the technical field of chips, and discloses a test method, a test device, computer equipment and a computer readable storage medium, and the method comprises the steps: obtaining a target TDP set for at least one to-be-tested chip, wherein the target TDP is related to the use type of the at least one to-be-tested chip; and the use type is used for indicating the type of a product to which the chip can be applied; and determining whether to adjust the target TDP or not according to the target TDP and the power consumption obtained when the at least one to-be-tested chip runs in the target test environment. Therefore, the deviation of the target TDP is reduced, and the accuracy of the TDP is improved.

Description

technical field [0001] The present application relates to the field of chip technology, in particular, to a testing method, device, computer equipment, and computer-readable storage medium. Background technique [0002] The thermal design power (Thermal Design Power, TDP) is used to indicate the maximum heat dissipation that the chip may achieve when it is working at full load. The larger the TDP, the greater the heat generated by the chip when it is working. When carrying out heat dissipation design such as computer motherboard design, notebook computer heat dissipation system design, and large-scale computer heat dissipation design, it is necessary to take TDP as the minimum index of heat dissipation capacity design to ensure that when the power consumption of the chip reaches the maximum TDP, the equipment where the chip is applied (such as , computers and notebooks, etc.) can run normally. [0003] In the prior art, the TDP is usually determined according to the power ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30G06F11/22
CPCG06F11/3058G06F11/2205Y02D10/00
Inventor 江殿宇苏航刘佳曾维
Owner PHYTIUM TECH CO LTD