Method for detecting defects in blind hole through retest AOI machine

Abstract

The invention discloses a method for detecting defects in a blind hole through a retest AOI machine. The method comprises the following steps that S1, it is confirmed that connection is established between the retest AOI machine and an MES management system; S2, it is confirmed that a detected standard product is located at a detection position, and lightening is conducted; S3, a side camera photographs the product on the detection position and stores the picture; S4, template registration is conducted by using the picture stored in the step S3, the picture is taken as a template picture, and the position of the blind hole in the product is shielded by the template picture; S5, the product subjected to manual blind hole detection is adopted for testing, it is confirmed that the product is located at the detection position on a retest AOI machine table, and the step S3 is repeated; S6, the retest AOI machine calculates the picture obtained in the step S5 by adopting a special-shaped curved edge algorithm, and judges whether the picture is an in-hole non-defective product or an in-hole defective product; and S7, if a judgment result is consistent with an artificial blind hole detection result, the retest AOI machine can be normally put into production for use. According to the invention, batch automatic detection of defective products in blind holes can be carried out, and the production efficiency is effectively improved.

Description

technical field [0001] The invention relates to the field of blind hole detection methods, in particular to a method for retesting AOI machines to detect defects in blind holes. Background technique [0002] At present, the retest AOI machine can only detect the poor electrical performance of the product, such as bright spots, bright clusters, dark spots, etc. after the product is lit, but the defect in the blind hole cannot be detected, because the blind hole does not emit light, and the camera images Defects in the hole cannot be confirmed. In the prior art, the blind holes on the product are generally directly shielded during detection. Using this method will lead to 100% missed detection of defects in the holes, and eventually lead to the flow of defective products; in addition, the blind holes in the prior art If the defect in the hole is detected, it is generally carried out manually, and the detection efficiency and accuracy are low. At the same time, there is a prob...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to overcome the deficiencies of the prior art, to provide a method for retesting AOI machines to detect defects in blind holes, to solve the problems of low detection efficiency and accuracy in blind holes in the prior art, and at the same time Solve the problem of misjudgment in the detection process

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