Instrument inspection system
A technology for inspection systems and instruments, which is applied in the field of instrument inspection systems, can solve problems such as abnormal misjudgment of the control system, troublesome operation of the valve cooling system, safety, stability, and reliable operation, and long detection time, and achieve the effect of improving the efficiency of calibration
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[0022] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the application are given in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.
[0023] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in the specification of the application are only for the purpose of describing specific embodiments, and are not intended to limit the application.
[0024] It can be understood that the terms "first", "second" and the like used in this application may be...
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