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Millimeter wave integrated test fixture

A test fixture and millimeter-wave technology, applied in radio wave measurement systems, instruments, etc., can solve the problem of low insulator test accuracy, improve test efficiency, improve accuracy, and ensure reliability and continuity.

Pending Publication Date: 2022-02-15
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a millimeter wave integrated test fixture, aiming to solve the problem of low accuracy of insulator testing

Method used

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Embodiment Construction

[0030] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0031] Please also refer to Figure 1 to Figure 5 , Figure 8 to Figure 11 , the millimeter wave integrated test fixture provided by the present invention will now be described. The millimeter-wave integrated test fixture includes a base plate 8, a test tooling 4, a guide plate 3, a test line 1, a test support plate 7, and an upper gland 5, and the base plate 8 is provided with a test installation position for placing the TR assembly 6; The tooling 4 is arranged on the antenna end of the TR assembly 6, and the test tooling 4 is provided with a socket 41 coaxial w...

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Abstract

The invention provides a millimeter wave integrated test fixture, and belongs to the technical field of radio frequency microwave assemblies, the millimeter wave integrated test fixture comprises a bottom plate, a test tool, a guide plate, a test line, a test support plate and an upper gland, and the bottom plate is provided with a test installation position for placing a TR assembly; the test tool is arranged at the antenna end of the TR assembly; the guide plate is fixed on the bottom plate, is positioned on one side, far away from the TR assembly, of the test tool, and can tightly press the test tool at the antenna end of the TR assembly; a first joint of the test wire passes through the guide hole and the jack to be plugged with the insulator; the test support plate is fixed on the bottom plate and is arranged at the radio frequency end of the TR assembly; and the guide plate, the test support plate and the upper gland position the TR assembly on the test installation position of the bottom plate. According to the millimeter wave integrated test fixture provided by the invention, through the test tool and the guide plate, the reliability and continuity of coaxial connection of the test line and the insulator of the TR assembly are ensured, so that the simultaneous good contact of the multi-channel insulator is ensured, and the accuracy and the test efficiency of the insulator test are improved.

Description

technical field [0001] The invention belongs to the technical field of radio frequency microwave components, and more specifically relates to a millimeter wave integrated test fixture. Background technique [0002] With the rapid development of RF devices, the requirements for the S-parameter test technology of RF devices are becoming more and more stringent. The test connection of the vector network analyzer used for testing is generally a coaxial interface, and the input / output ports of the device are generally not coaxial. of. In view of this, the corresponding test fixture is generally designed, and the error introduced by the non-coaxial RF test fixture is relatively large, which cannot be ignored. When calibrating the non-coaxial test fixture, the error introduced by it must be considered. Therefore, it is very meaningful to study the error introduced by the non-coaxial RF test fixture. [0003] In order to achieve highly integrated and miniaturized design of millime...

Claims

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Application Information

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IPC IPC(8): G01S7/40
CPCG01S7/40
Inventor 连智富卜爱民王立发袁彪张志谦刘晓红郝金中郝岩董雪肖宁郭建靳英策胡占奎滑国红杨国喆马力赵晨安
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP