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Field test method for researching stress resistance of different wheat lines in same growth period

A field test, stress resistance technology, applied in horticultural methods, botanical equipment and methods, horticulture, etc., can solve problems such as unfavorable test effects, and achieve the effect of improving test accuracy

Active Publication Date: 2022-02-18
ANHUI AGRICULTURAL UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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This is not conducive to obtaining real experimental results

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  • Field test method for researching stress resistance of different wheat lines in same growth period
  • Field test method for researching stress resistance of different wheat lines in same growth period
  • Field test method for researching stress resistance of different wheat lines in same growth period

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Embodiment 1

[0035] The method of the present invention is specifically described by taking the study of the differences in waterlogging adversity in the same growth period of wheat lines with different growth periods as an example:

[0036] (1) Light source setting method:

[0037] A 19W Philips LED energy-saving lamp is used as the light source, and the height of the light source is set at a height of 100cm from the ground. The distance between two adjacent light sources is set to 50cm. Set the time to turn on the light source according to the sunshine situation, and cut off the light source from 22:00 every day to 02:00 the next day to ensure that the sunshine duration of the wheat near the light source is kept at 20 hours a day.

[0038] (2) Wheat planting:

[0039] Yangmai 18 and Yannong 19 and other wheat varieties were used as test materials, planted perpendicular to the light source, each variety was planted in 6 rows, the row length was 6 meters, the row spacing was 20 cm, the p...

Embodiment 2

[0056] Taking the study of wheat strains with different growth periods in the same growth period as an example of high-temperature adversity differences, the method of the present invention is specifically described:

[0057] (1) Light source setting method:

[0058] A 19W Philips LED energy-saving lamp is used as the light source, and the height of the light source is set at a height of 120cm from the ground. The distance between two adjacent light sources is set to 100cm. Set the time to turn on the light source according to the sunshine situation, and cut off the light source from 21:00 to 03:00 the next day to ensure that the sunshine duration of the wheat near the light source is kept at 18 hours a day.

[0059] (2) Wheat planting:

[0060] Yangmai 18 and Yannong 19 were used as test materials, and the pot test method was adopted. The pot was 28 cm high, 20 cm in diameter, and had 6 drainage holes at the bottom. The test soil was taken from the topsoil of the field cul...

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Abstract

The invention belongs to the technical field of wheat cultivation, and particularly relates to a field test method for researching stress resistance of different wheat lines in the same growth period. The field test method comprises the following steps: arranging a group of artificial light sources which are distributed along a straight line in the field, and enabling the daily illumination duration to be 18-20 hours; planting wheat of different strains on the two sides of the artificial light source respectively, where the distribution direction of wheat rows of the wheat of different strains in the field is perpendicular to the artificial light source; in the direction of wheat rows, the wheat showing the difference of the growth process, performing stress treatment on the basis, and selecting and comparing the wheat at different positions of the wheat rows, so that the stress resistance difference comparison of wheat lines with different growth periods in the same growth period is realized. According to the invention, plant samples of wheat lines in different growth and development processes in the same growth period are obtained at the same time, so that stress resistance difference comparison is performed, and the test accuracy is improved.

Description

technical field [0001] The invention belongs to the technical field of wheat cultivation, and in particular relates to a field test method for studying stress resistance of different wheat strains at the same growth period. Background technique [0002] Since different types of wheat have different growth periods, different wheat lines have different growth periods at the same time. At present, in the research on the difference of stress resistance of different wheat strains, the main sampling period is the key growth period of the growth and development of wheat strains (such as jointing stage, heading stage, flowering stage and grain filling stage). However, due to the inconsistent growth and development process of different wheat strains, different wheat strains are often in different growth stages when they encounter adversity damage or undergo adversity treatment. If the adversity damage occurs naturally, since the growth stages of different wheat strains are inconsist...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A01G7/04A01G22/20A01G7/06
CPCA01G7/045A01G22/20A01G7/06Y02P60/14
Inventor 马尚宇王艳艳耿兵婕任赵平黄正来张文静樊永惠陈研叶苗苗
Owner ANHUI AGRICULTURAL UNIVERSITY
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