Display device inspection method and display device inspection apparatus
A technology of display device and inspection method, applied in measurement devices, optical testing flaws/defects, instruments, etc., can solve problems such as bad particles
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[0063] reference and attached Figure 1 Advantages and features of the present invention and methods of realizing them will become clear from the embodiments described later. However, the present invention is not limited to the embodiments invented below, and can be implemented in various forms different from each other, and this embodiment is only to complete the invention of the present invention and to completely convey the scope of the invention to the art to which the present invention pertains. It is provided by a person having ordinary knowledge in the field, and the present invention is limited only by the scope of the claims.
[0064] References to elements or layers being "On" other elements or layers include all instances where the other elements are directly on the other elements or with other layers or other elements interposed therebetween. Likewise, references to "Below", "Left" and "Right" include the case of being directly adjacent to other elements or with o...
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