Image location marking and identifying method based on view overlapping
An image and field of view technology, applied in the field of image location labeling and recognition based on overlapping fields of view, can solve the problems of difficult model training, inability to accurately obtain positive samples of query images, etc., and achieve the effect of high recall rate
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[0041] In order to make the above-mentioned features and advantages of the present invention more obvious and easy to understand, the following embodiments are given and described in detail with the accompanying drawings as follows.
[0042] The embodiment of the present invention proposes an image location labeling and recognition method based on overlapping fields of view. First, multi-threshold screening is used to mine potential positive samples of the query image, then the multi-scale sub-regions of the image are cropped and the similarity between the image regions is calculated. The regional similarity filters the pseudo-positive samples and identifies the overlapping regions of the field of view between the query image and the real positive samples, and constructs field-of-view overlapping annotations for the dataset. Further use the dataset with overlapping visual field annotations to train the model, use NetVLAD to extract the features of images or regions, and calcula...
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