Disc chip testing board and phase-shift radio-frequency signal generating circuit thereof

Abstract

The high temperature lifetime test of disc chip can be realized by using signal level voltage divider, high-pass filter and signal generating circuit of phase shifting radio-frequency in phase shifter to produce phase shifting radio-frequency signal required by analog circuit block of test disc chip based on a frequency varying digital input signal provided by test equipment.

Description

technical field [0001] The present invention relates to a test board, and in particular to an optical disc chip test board and a phase-shifting radio frequency signal generating circuit therein. Background technique [0002] For a long time, storage media have played an indispensable role in computer systems. Therefore, the scientific and technological circles continue to invest in the research of storage media, and have also made great progress. It involves not only the type of storage media, but also its stability and storage capacity. Recently, due to the advantages of high stability and high storage capacity of optical discs, various optical disc products with different characteristics are constantly being introduced, and their application scope is becoming more and more popular. [0003] Generally speaking, the drive control circuit of the optical disc device will be made into an optical disc chip to save volume and cost. Put it on an optical disc chip test board, th...

AI Technical Summary

Problems solved by technology

[0004] In test equipment similar to HTOL, most of its suppliers are digital input signals. For the peak pairs that need to receive the output of an optical pickup head (pick up head) such as a Digital Versatile Disc (DVD) For optical disc chips with multiple phase-shifted RF signals with a peak value of 75mV and a phase shift between them, it obviously cannot meet the needs, which makes testing difficult

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