Predictive method for surplus life, temperature testing structure and electronic device

An electronic device and life prediction technology, applied in the field of remaining life, can solve problems such as difficulties and achieve the effect of ensuring insulation performance
CN1439867AInactive Publication Date: 2003-09-03ORMON CORP
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
ORMON CORP
Publication Date
2003-09-03
Estimated Expiration
Not applicable · inactive patent

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Abstract

The patent relates to a remaining lifetime estimating method, a temperature detection structure and an electronic equipment which ensures proper maintenance control without affecting a production process or the like by easily identify a residual service life. A temperature of an electrolytic capacitor 24 incorporated in equipment is detected, a remaining lifetime in actual use is calculated based on a temperature-lifetime law, and the remaining lifetime is indicated. A thin film tape 23 is wound around a temperature sensor 22 for insulation, and the electrolytic capacitor 24 and the temperature sensor 22 are accommodated in a heat-shrinkable tube 25, the secondary temperature sensor 22 is brought into tight contact with the primary electrolytic capacitor 24.
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Description

technical field

[0001] The present invention relates to a method of predicting the remaining life of a capacitor and the like, a temperature detection structure suitable for the method, and various electronic devices such as a power supply unit equipped with a capacitor. Background technique

[0002] In such an electronic device, for example, in a power supply device, the life of an electrolytic capacitor having the shortest life among circuit components used therein is predicted as the life of the power supply device.

[0003] As is well known, the life of an electrolytic capacitor can be calculated by the following calculation formula based on Arrhenius' law, which is a temperature-life law that expresses the relationship between temperature and life.

[0004] Lx=Lo×2 (To-tx) / 10 ×k

[0005] Lx: Estimated lifetime in actual use (hours)

[0006] Lo: Guaranteed life at the highest operating temperature (hours)

[0007] To: maximum operating temperature (°C)

[0008] tx: ...

Claims

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