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Instrument for loss-free measuring thickness of thin layer

A technology for measuring layers and thin layers, applied in measuring devices, electromagnetic measuring devices, and using electric/magnetic devices to transmit sensing components, etc., can solve problems such as difficult to place probes according to regulations, and the processing of shells is very laborious, etc., to achieve structural Small size and cost-effective effect

Inactive Publication Date: 2004-06-02
赫尔穆特菲舍尔房地产有限及两合公司
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AI Technical Summary

Problems solved by technology

Difficult to place the probe as specified because the probe is set at an angle relative to the housing
Furthermore, the machining of such housings is very complex

Method used

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  • Instrument for loss-free measuring thickness of thin layer

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Embodiment Construction

[0020] FIG. 1 shows a perspective view of a device 11 for the non-destructive measurement of the thickness of thin layers. The layer thickness measuring device can operate according to the eddy current measurement method as well as the magnetic induction measurement method. It is also possible to combine both measurement methods in one device 11 . The measuring range of the layer thickness is, for example, up to 1.500 μm. The measurement method is chosen based on the base layer—on which the topping layer is placed.

[0021] The device 11 includes a housing 12 with a probe 14 . The probe 14 has a mounting ball (not shown in detail) for placement on a measuring object 16 . In addition, measuring elements are provided in order to perform measurements according to the method used and to transmit the measured signals to a computing unit arranged in the housing 12 . In the embodiment shown in FIG. 1 , the probe 14 is disposed on the bottom surface 18 of the housing 12 . The pro...

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Abstract

An apparatus for non-destructive measurement of the thickness of thin layers, has a housing and a probe which is connected to an evaluation unit and to which signals are emitted during a measurement for determining the layer thickness, and having a display apparatus which indicates at least the measurement data from the evaluation unit. At least one further display apparatus is positioned on the housing away from the plane of the first display apparatus.

Description

technical field [0001] The invention relates to a device for the non-destructive measurement of the thickness of thin layers. Background technique [0002] A device is known for the non-destructive measurement of the thickness of thin layers which can be easily operated with one hand. This portable instrument can be used fixedly and mobilely in the workshop or directly on the spot. This device is placed on the layer to be inspected in order to achieve the measurement. This value can be read on a display after the measurement has been obtained. [0003] A device is known which has a substantially rectangular housing, wherein on one narrow side of the housing there is a measuring probe for layer thickness measurement and opposite the measuring probe there is a display device, which has a The 45° angle is provided between the narrow side opposite the measurement probe and the front face. Furthermore, the device has a measuring probe which can be removed from the housing and...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D7/00G01B21/08G09F9/40
CPCG01B21/08
Inventor 该发明人要求不公开其姓名
Owner 赫尔穆特菲舍尔房地产有限及两合公司
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