Raster projecting three-dimensional outline measuring apparatus and method based on phase shift

A technology of three-dimensional profile and grating projection, which is applied in the field of three-dimensional sensing and measurement, and can solve the problems of low measurement accuracy, low precision, and low efficiency
CN1584499AInactive Publication Date: 2005-02-23XI AN JIAOTONG UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
XI AN JIAOTONG UNIV
Publication Date
2005-02-23
Estimated Expiration
Not applicable · inactive patent

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Abstract

A method for measuring three-dimensional outline based on raster projection of phase shift includes projecting raster picture with sine distribution on measured object; finalizing phase shift procedure by controlling projective fring with computer; using CCD camera, image collecting card and computer to work out trans shaped raster pictures and three-dimensional face shape of the object. The device for realizing the method is also disclosed by the present invention.
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Description

technical field

[0001] The invention belongs to the field of three-dimensional sensing and measurement, in particular to a grating projection type three-dimensional profile measurement device and measurement method based on phase shift. Background technique

[0002] Three-dimensional object surface profile measurement technology is one of the hotspots of three-dimensional sensing and measurement research at home and abroad. It is widely used in aerospace, on-line inspection and quality control, machinery manufacturing, medical diagnosis, computer-aided design / manufacturing, robot vision systems, etc. field. At present, there are mainly the following measurement methods: 1. Laser single-point measurement method. Since this method can only measure one point at a time, although the measurement accuracy is high, the efficiency is extremely low; 2. Laser line scanning method (abbreviated as optical section method), This method is single-line scanning, which is more efficient and...

Claims

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