Method and system for testing computer platform

A test method and test system technology, applied in the field of computer information, can solve problems such as time-consuming and laborious, increasing the burden on testers, and failing to generate test results.

Inactive Publication Date: 2006-07-05
INVENTEC CORP
View PDF0 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the above-mentioned disadvantage of manipulating the computer platform to execute the test program is that the process is time-consuming, laborious and inefficient, and often cannot produce correct test results due to human manipulation errors
In additio

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for testing computer platform
  • Method and system for testing computer platform
  • Method and system for testing computer platform

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0015] Embodiments of the computer platform testing method and system of the present invention will be described in detail below with reference to the accompanying drawings.

[0016] figure 1 That is, the application structure and the basic structure of the object-oriented component model (object-oriented component model) of the computer platform testing system of the present invention (the part included in the dotted box indicated by the reference numeral 100 ) are shown. As shown in the figure, the computer platform test system 100 of the present invention is mounted on a computer platform 10 in practical application, and an automated test program is provided for the host circuit 20 of the computer platform 10, such as including an integral computer motherboard or an external Test procedures for function expansion circuit cards. In practical applications, the computer platform testing system 100 of the present invention can, for example, be applied to various required testi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention is a computer platform testing method and system, assorted with a computer platform and providing an automated test program for a host computer circuit of the computer platform; and the testing system comprises: hardware specification data input module, hardware specification database module, hardware specification data reading module, test signal generating module, test signal transmission module, control stationmonitoring module, comparing module and error report generating module. As the personnel test different types of computer platforms, different hardware specification data are inputted as test parameters, an automated test program for the computer platforms of different types each and an error report is automatically generated, thus making developers more conveniently and effectively correct various defects.

Description

technical field [0001] The present invention relates to a computer information technology, in particular to a computer platform testing method and system, which is applied to a computer platform, provides an automated test program for the host circuit of the computer platform, and tests the computer platform to be tested. Whether there are defects in the host circuit, and an error report is automatically generated to allow developers to correct various defects more quickly and efficiently. Background technique [0002] When a computer manufacturer develops and manufactures a computer platform product (such as a computer motherboard or a function expansion circuit card), it usually conducts a series of testing procedures before going on the market to test whether the computer platform product can fully operate normally. If any component or circuit is found to be defective and unable to operate normally during the test, the tester must record the abnormal operating condition a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F11/36
Inventor 卢盈志李浚溢张启聪吴俊龙余亮宏李家兴
Owner INVENTEC CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap