Unlock instant, AI-driven research and patent intelligence for your innovation.

Dual spectrum analyzer measurement system

A spectrum analysis and analyzer technology, applied in the field of dual spectrum analyzer measurement systems, can solve the problems of lack of spectrum analyzer frequency selectivity, image frequency suppression and large-scale measurement capabilities.

Inactive Publication Date: 2006-11-29
AGILENT TECH INC
View PDF0 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although signal source analyzers have high measurement sensitivity and can provide low-noise measurements of received signals, signal source analyzers lack the frequency selectivity, image frequency rejection, and wide-range measurement capabilities of spectrum analyzers, which are more A general and more general class of measuring instruments

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Dual spectrum analyzer measurement system
  • Dual spectrum analyzer measurement system
  • Dual spectrum analyzer measurement system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0009] Figure 1A The properties measured by the spectrum analyzer are shown. A typical spectrum analyzer SA includes a front-end / intermediate frequency (IF) converter 12 that receives an input signal s(t) and provides an IF signal (not shown) in response to the received input signal s(t). An integrating (IQ) detector 14 receives the IF signal and provides a measurement signal d(t) to a display unit 16 coupled to the IQ detector 14 . The measurement signal d(t) is usually a digital signal comprising groups of samples representing the magnitude and phase variation of the input signal s(t) with frequency. The display unit 16 processes the measurement signal d(t) to provide a representation of the spectral content of the input signal s(t) on a display 18 or other output device.

[0010] The spectrum analyzer SA contributes noise n(t) to the measurement signal d(t) acquired by the spectrum analyzer. Figure 1B A vector diagram showing the influence of the measurement signal d(t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A dual spectrum analyzer measurement system reduces the effects of noise on acquired measurements, enabling power of a received input signal, and the noise of each spectrum analyzer in the dual spectrum analyzer measurement system, to be determined.

Description

technical field [0001] The invention relates to a dual spectrum analyzer measurement system. Background technique [0002] In many measurement applications, the measurement sensitivity of a spectrum analyzer can be increased by reducing the effect of noise on the measurements taken by the spectrum analyzer. One technique for reducing the effects of noise is noise subtraction, which involves accurately characterizing spectrum analyzer noise and subtracting the characterized noise from measurements taken by the spectrum analyzer. However, such noise characterization can be time-consuming because it typically relies on averaging many repeated measurements of the spectrum analyzer. In addition, repeated measurements also include a wide range of carrier measurement frequencies and offset frequencies to accommodate various operating conditions associated with the wide range measurement capabilities of typical spectrum analyzers. [0003] A signal source analyzer is a two-channel...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/16
CPCG01R23/16G01R23/18
Inventor 温·J·马尔
Owner AGILENT TECH INC