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Method for detecting 3d measurement data using allowable error zone

A technology of tolerance, three-dimensional measurement, applied in measurement devices, electrical digital data processing, special data processing applications, etc., can solve the problems of time-consuming, users can not be sure whether the comparison results of measurement data are accurate, reliability, etc. question

Active Publication Date: 2006-12-13
INUS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] However, there is a problem with this measurement method of the above-mentioned prior art that it takes too much time during the measurement of the target because the user has to manually select the target points to be compared from the measurement data
[0010] Although there are methods to automatically select the target points to be compared from the measurement data, there are still reliability problems in this method, that is, whether these selected points are actually the points to be compared
[0011] Correspondingly, it is impossible for the user to know with certainty whether the comparison of the measured data is accurate

Method used

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  • Method for detecting 3d measurement data using allowable error zone
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  • Method for detecting 3d measurement data using allowable error zone

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Embodiment Construction

[0035] Now, preferred embodiments of the present invention will be described in detail.

[0036] figure 1 is a block diagram of a system for detecting 3D measurement data using a tolerance zone in accordance with the present invention.

[0037] refer to figure 1 , the system includes: a scanner 10 for measuring the target to be measured; a control unit 20 for controlling the system as a whole; a user interface 30 for providing an interface to the user; and a design for storing the design data of the target data storage unit 40 .

[0038] The scanner 10 is a device for measuring a target and obtaining measurement data. The scanner 10 may be a non-contact 3D scanner.

[0039] The control unit 20 analyzes the design data of the target, sets auxiliary geometric figure data for measurement from the design data of the target, sets an allowable error area of ​​the auxiliary geometric figure data for measurement based on allowable error information input from the user interface 30...

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Abstract

A method of detecting 3D measurement data using an allowable error zone is provided. The method detects 3D measurement data that corresponds to a preset measurement allowable error zone for each basic diagram when detecting 3D measurement data. For that purpose, a control unit generates auxiliary geometry data from a design data storage unit on the basis of analysis information of the design data; sets an allowable error zone for measurement in the auxiliary geometry data on the basis of allowable error information inputted from a user interface; controls a coordinate system of measurement data to coincide with a coordinate system of design data of the object; extracts candidate point groups included in the allowable error zone for measurement of the auxiliary geometry data from the measurement data; and fits the candidate point groups extracted from the candidate point groups included in the allowable error zone for measurement to output the fitted candidate point groups to the user interface.

Description

technical field [0001] The present invention relates to a method for automatically detecting three-dimensional (3D) measurement data, and in particular to a method for detecting 3D measurement data. When detecting 3D measurement data, the method detects the The 3D measurement data of the tolerance zone. Background technique [0002] Measurement using a 3D scanner can be performed by a contact method of directly contacting an object to be measured. Furthermore, through a non-contact method of digitally processing an image obtained by photographing a target using an imaging device, shape information of the target can be obtained without physically touching the target. [0003] In the case of manufacturing semiconductor wafers, measuring precision instruments, and reproducing 3D images, for targets to be measured that are vulnerable to external pressure, or high-precision ultra-small parts, measurement using a 3D non-contact scanner is used to obtain such The shape informatio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/00G06F17/50G01B21/00
CPCG01N2021/9516G01N21/9515G01B21/045G06V10/10
Inventor 裴奭勋李东勋金承烨赵成旭
Owner INUS TECH
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