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Method and apparatus for analyzing measurements

a measurement and measurement technology, applied in the field of measurement apparatus, can solve the problem that the present available statistical tools do not allow the separation of deterministic and random components

Inactive Publication Date: 2005-02-03
WAVECREST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

A commonly encountered problem in processing measurements is to accurately determine the physical processes and key parameters associated with the distribution.
The present available statistical tools do not allow separation of deterministic and random components.

Method used

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  • Method and apparatus for analyzing measurements
  • Method and apparatus for analyzing measurements

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Embodiment Construction

In the following description of the preferred embodiment, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration a specific embodiment in which the invention may be practiced. It is to be understood that other embodiments may be utilized and structural changes may be made without departing from the scope of the present invention.

FIG. 1 is an exemplary illustration of a representative hardware environment for a signal analyzing system 100 according an embodiment of the present invention. A typical configuration may include a measurement apparatus 102 that measures the time interval between two events (start and stop) through counters. A measurement apparatus is disclosed in U.S. Pat. No. 4,908,784, which is hereby incorporated by reference. A typical measurement apparatus is the Wavecrest DTS-2075, available from Wavecrest Corporation, Edina, Minn.

Those skilled in the art will recognize that other systems that enable ...

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PUM

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Abstract

A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates in general to measurement apparatus; more particularly, to a system and method for analyzing components of a distribution; and more particularly still, to a system and method for analyzing deterministic and random components of signals. 2. Description of Related Art A commonly encountered problem in processing measurements is to accurately determine the physical processes and key parameters associated with the distribution. In many cases, a distribution may have both deterministic and random components associated with it. It is essential to extract important information on what kind of is physical processes are involved in the distribution and how much each process contributes to the measured distribution. The present available statistical tools do not allow separation of deterministic and random components. Instead such tools determine a mean and sigma for the entire distribution. The present inventio...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G01D3/028G01D21/00G06F15/00G06F17/18G06F17/40
CPCG06K9/00496G06F17/18G06F2218/00G06F8/74
Inventor LI, PENGJESSEN, ROSS ADAMWILSTRUP, JAN BRIANPETRICH, DENNIS
Owner WAVECREST
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