Generation and measurement of timing delays by digital phase error compensation

Abstract

A circuit and method for generating a delayed event following a trigger pulse occurring at a random time between clock pulses is disclosed. The circuit includes a clock circuit, a voltage converter, an analog-to-digital converter circuit, a memory storage circuit, and a summing circuit. The method includes representing the time between the triggering pulse and a subsequent clock pulse as a voltage, converting the voltage to a stored digital value, and defining a desired delay time by adding a first time determined by counting a predetermined number of clock cycles to a second time determined by converting the stored digital value first to an analog value and then to a time value.

Description

[0001] This application is a divisional of U.S. patent application Ser. No. 10 / 744,834 filed Dec. 23, 2003, which claims priority under 35 U.S.C. § 119(e) to U.S. Provisional Application Ser. No. 60 / 455572, filed on Mar. 17, 2003, the disclosure of both which are hereby incorporated by reference herein.FIELD OF THE INVENTION [0002] This invention relates generally to apparatus and methods for the generation of events following a trigger pulse. It is disclosed in the context of an electronic circuit and method for the generation of events following a trigger pulse when the trigger pulse occurs at an indeterminate time between clock pulses. However, it is believed to be useful in other applications as well. BACKGROUND OF THE INVENTION [0003] The generation of events following an input trigger pulse is a common requirement in electrical applications. Generally, a timing delay generator receives a trigger signal and counts pulses of an internally generated master clock to generate a kno...

AI Technical Summary

Benefits of technology

This approach allows for the generation of precise delays with reduced jitter, enabling the production of output trigger events with desired pulse widths and delays, even at high clock frequencies, without the need for extremely high-speed clocks, thus overcoming practical limitations of current technology.

Problems solved by technology

When the trigger signal is received at a random time between the master clock pulses, there is inherent timing uncertainty.

This timing uncertainty, commonly called jitter, is caused from the triggering event not being related in phase to the master clock.

In particular, the timing uncertainty relates to the temporal difference between the trigger signal and the master clock pulse.

Therefore, the timing uncertainty relates to the period of the master clock.

However, increasing the speed of the master clock typically comes at the expense of increased circuit complexity and cost.

Additionally, there are practical limits to the speed of a master clock.

However, one terahertz clocks are not practical with currently available technology.

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