Stochastic block allocation for improved wear leveling

Inactive Publication Date: 2012-10-18
APPLE INC
View PDF11 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0005]Systems and methods are disclosed for stochastic block allocation for improved wear leveling. As used herein, “stochastic” block allocation can

Problems solved by technology

When a system experiences a power loss, however, unrecorded statistics may become lost.
As a result,

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Stochastic block allocation for improved wear leveling
  • Stochastic block allocation for improved wear leveling
  • Stochastic block allocation for improved wear leveling

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014]Systems and methods for stochastic block allocation for improved wear leveling are provided. As used herein, “stochastic” block allocation can refer to the non-deterministic selection of a block, where one or more blocks or super blocks have a random or probabilistic chance of being allocated.

[0015]A NVM interface of a system can probabilistically allocate a block or super block based on statistics associated with the block or super block. The block or super block may be allocated for any suitable programming purposes including, for example, host writing, garbage collection, and wear leveling. In some embodiments, in order to allocate a particular super block, a set of super blocks can be selected from multiple super blocks of a NVM based on a pre-determined threshold of a number of cycles (e.g., erase cycles and / or write cycles). For example, if the NVM interface determines that a lower-cycled super block needs to be allocated for dynamic host writes and garbage collection (“...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Systems and methods are disclosed for stochastic block allocation for improved wear leveling for a system having non-volatile memory (“NVM”). The system can probabilistically allocate a block or super block for wear leveling based on statistics associated with the block or super block. In some embodiments, the system can select a set of blocks or super blocks based on a pre-determined threshold of a number of cycles (e.g., erase cycles and/or write cycles). The block or super block can then be selected from the set of super blocks. In other embodiments, the system can use a fully stochastic approach by selecting a block or super block based on a biased random variable. The biased random variable may be generated based in part on the number of cycles associated with each block or super block of the NVM.

Description

BACKGROUND OF THE DISCLOSURE [0001]NAND flash memory, as well as other types of non-volatile memories (“NVMs”), are commonly used for mass storage. For example, consumer electronics such as portable media players often include flash memory to store music, videos, and other media.[0002]A NVM can include multiple blocks and / or super blocks. In order to extend the lifespan of a NVM, it is preferable to have similar wear on all of the super blocks of a NVM. Therefore, in some cases, electronic devices may perform an operation known as “wear leveling” on one or more super blocks of the NVM.[0003]In order to determine which super block to select for wear leveling, a system may rely on statistics associated with each super block of the NVM. These statistics may indicate the number of times a particular super block has been erased or programmed, and are generally aggregated for a period of time before being recorded on the NVM.[0004]When a system experiences a power loss, however, unrecorde...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F12/02
CPCG06F3/064G06F3/0679G06F12/0246G06F2212/7211G11C16/349G06F7/588G06F3/0616
Inventor POST, DANIEL J.WAKRAT, NIR J.
Owner APPLE INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products