Probe head with linear probe

Abstract

A probe head includes a linear probe whose tail and head portions are flattened and thereby have elongated-shaped cross sections, and upper and lower die units having upper and lower installation holes accommodating the tail and head portions respectively. First and second widths of the body portion are respectively larger and smaller than first and second widths of at least one of the tail and head portions. The lower installation hole includes a lower elongated-shaped hole and an upper circular hole with diameter larger than or equal to length of the elongated-shaped hole and larger than the first and second widths of the body portion. As a result, the probes of the same probe head are consistent in bending direction and moving behavior and prevented from self-rotation and drop. Besides, the wear of the probe and the dies is minimized, and the probe installation is convenient.

Description

BACKGROUND OF THE INVENTION1. Field of the Invention[0001]The present invention relates generally to probe heads and probes of probe cards and more particularly, to a probe head with a linear probe.2. Description of the Related Art[0002]Referring to FIG. 1, a conventional probe head 10 equipped with a plurality of linear probes 16 is shown. The conventional probe head 10 primarily includes at least two upper dies 12, at least two lower dies 14 and a plurality of probes 16. For simplifying the drawing, only one probe 16 is shown in FIG. 1. The head portion 162 of each of the probes 16, i.e. linear probes, is adapted to contact a conductive contact pad of a device under test (not shown), and the head portion 162 is inserted through the lower dies 14. The tail portion 164 of each of the probes 16 is adapted to be abutted against a conductive contact pad of a circuit board or space transfoinier (not shown), and the tail portion 164 is inserted through the upper dies 12. During the assem...

AI Technical Summary

Benefits of technology

The present invention provides a probe head with a linear probe that can achieve consistent bending direction and movement of the probes within the same probe head. This is achieved by setting different widths for the tail portion, body portion, and head portion, which results in a difference in area moment of inertia. By controlling the directions of deformation and movement of the linear probe, the probes are prevented from interference and short circuit. The flattening of the body portion and head portion in a way that their long sides are perpendicular to each other results in optimized effects. The lower stopping portion prevents probe drop and the elongated-shaped holes prevent self-rotation and wear. The upper installation hole with an elongated shape and a circular hole improve the movability of the probe and facilitate repair.

Problems solved by technology

In other words, the body portions 166 of the adjacent probes 16 may collide with each other, thereby not only deteriorating the aforesaid elastically adjusting effect and buffering effect but also causing wear to the body portions 166.

If the abrasion of the insulating layer on the surface of the body portions 166 causes electrical connection between the probes 16 colliding with each other, a short circuit may occur to damage the probe card or the device under test.

In addition, the conventional linear probe is liable to have the problem of probe drop, i.e. the probe 16 dropping from the downside of the lower die 14, or probe escape, i.e. the probe 16 being escaped from the upside of the upper die 12, during the assembly or maintenance of the probe card 10.

Such method is not suitable for the linear probe manufactured by cutting a cylindrical metal wire.

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