A various electrical characteristics and small test point testing module comprised of a carrier plate, a guide correction layer, a clamp pin layer, linear probes, first cushioning components, second cushioning components, travel adjustment rods, guide posts, and a base, wherein the carrier plate, the guide correction layer, and the clamp pin layer are capable of vertical ascension and descension along the same axis by means of the guide posts. The linear probes are inserted into the carrier plate, the guide correction layer, and the clamp pin layer such that their inner extremities are fixed at the clamp pin layer and their outer extremities are situated at the carrier plate position. The first cushioning components and the travel adjustment rods are disposed between the guide correction layer and the clamp pin layer, while the second cushioning components are disposed between the base and the clamp pin layer such that the carrier plate, the guide correction layer, and clamp pin layer all are supported by an elastic force and each linear probe is subjected to an equal magnitude of elastic force.