Loaded board test method

Abstract

The method includes wire carrier, needle dial, linear probes, buffer element of needle dial, buffer element of probes, guard plate, and linear bearing set etc. main elements. Being combined through linear bearing set, the needle dial and the wire carrier are spaced by the buffer element of needle dial. The needle dial consists of carrier plate, multiple blocks of guiding plate, and multiple plates for movement of needle. Each linear probe in vertical or tilting position is inserted to plug seat prearranged on the carrier plate, each guiding plate, and plate for movement of needle. Head end of linear probe is corresponding to point to be tested of object to be tested, and tail end of linear probe is inserted to the support part of buffer element of probe. Being in prearranged thickness, the guard plate is setup between the wire carrier and the needle dial in order to make test reach purposes of stable and accurate test.

Description

technical field [0001] The present invention relates to a test method for a mounted board, in particular to a test method for a mounted board that can provide more accurate, stable and reliable detection operations for a mounted board that has completed the installation of electrical components and has tiny measuring points method. Background technique [0002] The existing conventional equipment used to test the circuit boards that have completed the installation of electrical components (commonly known as ICT testing, or In Circuit Test) is roughly as follows: figure 1 As shown, it is mainly provided with a floating plate 10 for the bearing of the mounting board 1, on which a receiving groove 101 is provided at the corresponding position of the electrical component 11 of the mounting board 1, and a receiving groove 101 is provided at the corresponding position of the point 12 to be measured. There are through-holes 102; the cable tray 20 is composed of at least one splint...

AI Technical Summary

Problems solved by technology

[0007] 1. Since the design of the probe set 50 is extremely small, when the inner sleeve 502 itself is already extremely small, the elastic element 503 and the probe 504 which are movable and arranged on the inner sleeve 502 will be even smaller , so, not only is it extremely expensive and uneconomical in terms of manufacturing costs, especially, it also has the disadvantages of troublesome, inconvenient and uneconomical with a very high technical level in assembly.

[0008] 2. Since the elastic element 503 placed in the inner sleeve 502 is extremely small, its service life must not be long, and once the elastic element 503 is damaged, it will directly affect the test results. In this way, the operator must replace the probe set 50 regularly Under the circumstances, there are obviously more troublesome, inconvenient and uneconomical phenomena in implementation

[0009] 3. Since the outer sleeves 501 of the probe sets 50 are vertically inserted into the splint 201 fixed on the wire tray 20, the inner sleeves 502 and probes 504 are also vertical. In such a situation, it is inevitable that the minimum distance d between the centers of the probes 504 (as shown in the second figure) will only reach the state where the two outer sleeves 501 are adjacent, and cannot be further reduced (currently this The probe of the type test fixture can detect the minimum distance between the points to be measured is about 1.0mm or more), so, in view of the fact that the density of the points to be measured is getting smaller and smaller, it is a kind of fixture and probe The structure obviously has the disadvantage that it is not enough for practical needs.

[0010] 4. Since the probe 504 is loosely fitted behind the inner sleeve 502, the inner flange 5021 of the inner sleeve 502 is positioned against falling off, and the inner sleeve 502 is fitted behind the outer sleeve 501. The two concave points 5012 of the outer sleeve 5

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