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Piezoelectric thin film resonator

a thin film resonator and piezoelectric technology, applied in the direction of piezoelectric/electrostrictive/magnetostrictive devices, electrical apparatus, impedence networks, etc., can solve the problems of reducing filter bandwidth, vibration part of floating portion liable to warp, and reducing filter strength, so as to ensure the strength of the membrane without degrading the resonant properties, high reliability

Inactive Publication Date: 2008-02-05
MURATA MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides a piezoelectric thin film resonator that can ensure the strength of the membrane without degrading the resonant properties. Reinforcing films are formed in the vicinities of the boundaries between the floating portion and the support portions of the thin film member to reduce cracking and warping. The reinforcing films are not formed at the vibration parts of the thin film member, so the resonant properties are not degraded. The piezoelectric thin film resonator has a substrate, a thin film member, and reinforcing films. The thin film member has at least two support portions and a floating portion disposed over the substrate with an airspace layer provided therebetween. The reinforcing films are formed in the vicinities of the boundaries between the floating portion and the support portions of the thin film member. The piezoelectric thin film resonator can be easily handled in mounting and can be used in a piezoelectric thin film resonator, a piezoelectric filter, a duplexer, and a communication apparatus.

Problems solved by technology

In a piezoelectric thin film resonator having this type of structure, the thin film member includes support portions supported by the substrate and a floating portion floating over the substrate, the floating portion is supported by the support portions, a stress is liable to be concentrated on the vicinity of each boundary between the floating portion and the support portion, and as a result, cracking is liable to occur.
In addition, a vibration part of the floating portion is liable to warp.
When this resonator is used, the filter bandwidth is also decreased, and hence a desired filter cannot be formed.
In addition, in a dicing step, because of insufficient strength of the vibration part, diaphragm damage is liable to occur.
Furthermore, when the resonator is handled in mounting, since the vibration part is not covered for protection, a load is easily applied thereto, and hence elemental defects caused by damage are liable to be generated.

Method used

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Examples

Experimental program
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Effect test

example 1

[0081]FIG. 1 is a plan view schematically showing an important portion of the structure of a piezoelectric thin film resonator 10 according to Example 1. FIG. 2 is a cross-sectional view cut along the line II-II in FIG. 1.

[0082]The piezoelectric thin film resonator 10 has the structure that a dielectric film 16, a lower electrode 17a, a piezoelectric thin film 18, an upper electrode 17b, and reinforcing films 19a and 19b are formed on a substrate 11. Since an airspace layer 14 (see FIG. 2) formed by removing a sacrifice layer 13 (see FIG. 1) present between the substrate 11 and the dielectric film 16, a vibration part 12 has a structure which floats over the substrate 11. The vibration part 12 is formed by the dielectric film 16, the electrodes 17a and 17b overlapped with each other in lamination direction, and the piezoelectric thin film 18 between the lower electrode 17a and the upper electrode 17b.

[0083]The piezoelectric thin film resonator 10 is formed as described below.

[0084]...

example 2

[0095]FIG. 4 is a plan view schematically showing an important portion of the structure of a piezoelectric thin film resonator 30 according to Example 2. FIG. 5 is a cross-sectional view cut along the line V-V in FIG. 4.

[0096]The piezoelectric thin film resonator 30 has the structure, which is approximately equivalent to that in Example 1, in which a dielectric film 36, a lower electrode 37a, a piezoelectric thin film 38, an upper electrode 37b, and reinforcing films 39a and 39b are formed on a substrate 31. By the presence of an airspace layer 34 formed between the substrate 31 and the dielectric film 36, it is a structure in which a vibration part 32 floats over the substrate 31. The vibration part 32 is formed by a region 32 in which the electrodes 37a and 37b are overlapped with each other in the laminating direction and the vibration part 32 being composed of parts of the dielectric film 36, the lower electrode 37a, the piezoelectric thin film 38 and the upper electrode 37b.

[0...

example 3

[0101]FIG. 6 is a plan view schematically showing an important portion of the structure of a piezoelectric thin film resonator 40 according to Example 3.

[0102]The piezoelectric thin film resonator 40 has the structure which is approximately equivalent to that in Example 1; however, different from Example 1, two resonator elements are provided. That is, a dielectric film 46, a lower electrode 47a, a piezoelectric thin film 48, an upper electrode 47b and 47c, and reinforcing films 49a, 49b, 49c, 49d, and 49s are formed on a substrate. By the presence of an airspace layer formed by a sacrifice layer 43 provided between the substrate and the dielectric film 46, it is a structure that vibration parts 42s and 42t float over the substrate, the vibration parts 42s and 42t are formed by the dielectric film 46 in regions 42s and 42t that the lower electrode 47a is overlapped with the upper electrodes 47b and 47c and the piezoelectric thin film 48 in the laminating direction. The reinforcing f...

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Abstract

A piezoelectric thin film resonator that ensures the strength of a membrane without degrading the resonant properties and which can be easily handled in mounting. The piezoelectric thin film resonator has a substrate, a thin film member, and reinforcing films. The thin film member has at least two support portions supported by the substrate and a floating portion disposed over the substrate with a space provided therebetween and supported by the support portions. The floating portion includes a pair of excitation electrodes facing each other and a piezoelectric thin film provided therebetween. The reinforcing films are formed in the vicinities of the boundaries between the floating portion and the support portions of the thin film member.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]The present application is a continuation of International Application No. PCT / JP2005 / 008427, filed May 9, 2005, which claims priority to Japanese Patent Application No. JP2004-264281, filed, Sep. 10, 2004, the entire contents of each of these applications being incorporated herein by reference in their entirety.FIELD OF THE INVENTION [0002]The present invention relates to a piezoelectric thin film resonator.BACKGROUND OF THE INVENTION[0003]In a piezoelectric thin film resonator, a vibration part composed of a pair of excitation electrodes facing each other and a piezoelectric thin film provided therebetween must be acoustically separated from a substrate. Accordingly, some type of piezoelectric thin film resonator is formed so that a thin film member (membrane) partly floats over the substrate with an airspace layer provided therebetween.[0004]In a piezoelectric thin film resonator having this type of structure, the thin film member incl...

Claims

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Application Information

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Patent Type & Authority Patents(United States)
IPC IPC(8): H03H9/15H03H9/54H03H9/70H03H9/17H10N30/20
CPCH03H9/02133H03H9/173
Inventor FUJII, HIDETOSHIKUBO, RYUICHIYAMADA
Owner MURATA MFG CO LTD