Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Microwave multiparameter measuring device, and detecting method

A measurement device and microwave measurement technology, which are applied in measurement devices, material analysis using microwave means, and electrical digital data processing, etc., can solve the problems of single function, high measurement accuracy and cost performance, inconvenient use, etc., and achieve cost savings, Correct and rapid detection steps, cost-effective results

Inactive Publication Date: 2009-01-21
XIAMEN UNIV
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to aim at the shortcomings of the above-mentioned microwave automatic measuring device, such as single function and inconvenient use, to provide a device that can realize point frequency and sweep frequency measurement in manual and automatic states, and collect, calculate and display data. , error analysis and processing, measurement accuracy and high cost performance, especially suitable for microwave multi-parameter measurement devices and microwave multi-parameter detection methods that require manual operation and then automatic operation in microwave experiment teaching

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microwave multiparameter measuring device, and detecting method
  • Microwave multiparameter measuring device, and detecting method
  • Microwave multiparameter measuring device, and detecting method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] Such as figure 1 As shown, the microwave multi-parameter measurement device consists of microwave measurement system I and microwave network analyzer II.

[0037] The microwave measurement system I is equipped with a VCO voltage-controlled oscillator 1, an isolator 2, a variable attenuator 3, an absorption frequency meter 4, a waveguide measurement line 5 with a stepping motor, a device under test 6 and a crystal detector 7. The VCO voltage-controlled oscillator 1 is used as the microwave source, which generates microwave power with adjustable frequency. Fixed voltage can also obtain voltages of different amplitudes and arbitrary shapes, especially sawtooth wave voltages, so it is convenient to provide point frequency and frequency sweep signals of different frequency bands. The pointer ammeter head 21 can be connected with a liquid crystal display 22 and a printer 23 . In order to realize automatic measurement, the slotted measurement line (TC26 type) 5 is modified, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A microwave multi-parameter measurement device consists of microwave measurement unit including VCO microwave source of pressure-controlled oscillator, isolator, variable attenuator, absorption frequency meter, waveguide measurement line, stepping motor and crystal detector; microwave network analyzer including DC graded amplifier, driving circuit of stepping motor, generator of saw tooth wave, reference voltage circuit, two voltage-dividing circuits, blocking circuit, wave filtering circuit, embedded microcomputer, liquid crystal display, USB interface data collection card, etc.

Description

technical field [0001] The invention relates to a microwave measurement device, in particular to a microwave multiple parameter measurement device and a detection method thereof under the condition of spot frequency and frequency sweep in manual and automatic states. Background technique [0002] Most of the existing microwave measurement devices are those used in the industrial field, such as the invention of the 25th Institute of the Second Research Institute of the Ministry of Aerospace Industry, the Ministry of Petroleum Industry and the Oil Reservoir Physical Property Testing Center of the Academy of Petroleum Exploration and Development Research Institute with application number 86100707 The patent application provides a microwave measurement device for water saturation of rock core physical model used in petroleum development research. In order to solve the instantaneous distribution problem of water saturation of rock core physical model, the invention adopts multi-el...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N22/00G06F17/00
Inventor 肖芬倪祖荣林国春花健敏王冬
Owner XIAMEN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com