Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High common mode rejection ratio preamplifier

A preamplifier and high common-mode rejection technology, applied in the field of control, can solve problems such as difficult to achieve, poor chip performance, expensive differential preamplifier integrated chip, etc., to achieve high common-mode rejection ratio performance, high Differential mode gain, the effect of making the product easy to sell

Inactive Publication Date: 2009-07-22
TIANJIN UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The differential preamplifier integrated chip with excellent performance is very expensive, and the performance of the low-priced chip is very poor, so it is difficult to meet the needs of both performance and low cost.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High common mode rejection ratio preamplifier
  • High common mode rejection ratio preamplifier
  • High common mode rejection ratio preamplifier

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] Below in conjunction with accompanying drawing, the implementation of the present invention is described in detail as follows:

[0017] exist figure 1 Medium and high common-mode rejection ratio preamplifiers, whose parallel dual-op-amp instrumentation amplifier consists of an op-amp A 1 , Operational amplifier A 2 , resistance R 1 , R 2 , R 3 Composed of two sets of resistance-capacitance coupling circuits respectively composed of capacitance C 1 , resistance R 6 and capacitance C 2 , resistance R 7 Composition, the post-amplifier is composed of an integrated instrumentation amplifier A 4 , resistance R G Composed, the common mode signal sampling circuit is composed of resistor R 4 , R 5 , Rw composition.

[0018] where the operational amplifier A 1 , Operational amplifier A 2 The output terminals are respectively connected with the capacitor C 1 , capacitance C 2 with integrated instrumentation amplifier A 4 input connection. Resistance R 1 respecti...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The high common-mode rejection ratio preamplifier belongs to the electronic measurement and control technology. The output terminals of the parallel dual-operation amplifier instrument amplifier are respectively connected to two sets of resistance-capacitance coupling circuits, and the two sets of resistance-capacitance coupling circuits are respectively connected to the integrated instrument in the post-amplifier. The input terminal of the amplifier is connected, the common mode signal sampling circuit is respectively connected with the output terminal of the parallel-connected double operational amplifier instrument amplifier, and the two sets of resistance-capacitance coupling circuits are also connected with the common mode signal sampling circuit. It has: 1, the common mode rejection ratio is infinite, the output is a double-ended differential output signal, and it has nothing to do with the matching degree of its peripheral resistance. 2. Using an integrated instrument amplifier, and using a resistance-capacitance coupling circuit to isolate the DC signal, thus obtaining a high differential-mode gain and a high common-mode rejection ratio performance. 3. The overall structure is simple, the high common-mode rejection ratio is reliable, and the product is easy to manufacture and sell; it can be widely used in various bioelectric detection instruments such as ECG and EEG, and various measurement and control systems, with remarkable economic and social benefits.

Description

technical field [0001] The invention belongs to the category of control, and in particular relates to electronic measurement and control technology. Background technique [0002] At present, known instrumentation and measurement and control systems usually operate in a strong interference environment, especially in the presence of strong common-mode interference, so a high common-mode rejection ratio is the most important indicator of a differential preamplifier. Most of the current differential preamplifiers are composed of instrument amplifiers in the form of three operational amplifiers or dual operational amplifiers, or special differential preamplifier integrated chips. When the differential preamplifier circuit is composed of an instrument amplifier in the form of three op amps or two op amps, the circuit is complex, high in cost, poor in manufacturability, and low in performance. The differential preamplifier integrated chip with excellent performance is very expensi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03F3/45
Inventor 李刚林凌
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com