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Method for testing electronic components

A test method and technology of electronic components, applied in the field of testing

Inactive Publication Date: 2007-07-25
SHIHAIBO TECH DEV TIANJIN CITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Just because there is no suitable method to simply and effectively identify good and bad electronic components

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0006] The electronic component testing method uses the characteristics of the electronic component chip to conduct a reverse test, uses a special fixture to place the electronic component chip, and connects the interface circuit through a gold needle lead, and uses a dedicated embedded single-chip microcomputer system as the chip in the interface circuit. Provide the bus interface and the frequency signal required by the chip. The signal to be tested is input into the computer through the interface circuit and the A / D conversion circuit, collected by the computer, and then analyzed and processed by special software to judge whether the electronic components are qualified.

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PUM

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Abstract

A method for testing electronic element includes applying reverse test, connecting electronic chip to interface circuit through gold needle lead wire, using embedded monolithic computer to provide bus interface and required frequency signal to said chip, inputting signal to be tested to computer through interface circuit and A / D conversion circuit, collecting signal by computer and processing collected signal by special software for analyzing and judging whether electronic chip is qualified or not.

Description

technical field [0001] The invention belongs to the field of testing methods, in particular to the field of testing methods of electronic components. Background technique [0002] In today's increasingly fierce competition in the electronics industry, cost has become the most important indicator for enterprises. In order to reduce costs and reduce the scrap rate is one of the main means of various enterprises. In the past, electronic products that failed the test during the production process were still used as a whole. However, the many expensive electronic component chips on the circuit board, which cost a few dollars to several hundred dollars, are not completely damaged and can be used again by repairing them. It's just that there is no suitable method to simply and effectively identify good and bad electronic components. Contents of the invention [0003] The purpose of the present invention is to overcome the deficiencies of the prior art and provide an electronic c...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/01G01R31/02
Inventor 李平安
Owner SHIHAIBO TECH DEV TIANJIN CITY