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Sample preparation method of material containing silicon carbide used for x-ray spectrometric analysis

A spectral analysis, silicon carbide-containing technology, applied in the analysis of materials, material analysis using wave/particle radiation, preparation of samples for testing, etc. There are many operation steps and other problems, so as to achieve the effect of reliable sample preparation method, shorten the detection cycle and reduce environmental pollution.

Active Publication Date: 2007-08-01
BAOSHAN IRON & STEEL CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0015] However, the above-mentioned patent CN1249425A first needs to adopt conventional methods to convert the elements to be measured in the sample into soluble salts, which requires a large amount of acid, which is not conducive to environmental protection, has many operating steps, and takes a long time, and it is impossible to convert silicon carbide into soluble salts. molten salts

Method used

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Examples

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Embodiment 1

[0041] Embodiment 1, adopt the present invention to contain the K in the silicon carbide aluminum refractory material 2 O, Fe 2 o 3 , MnO, MgO, CaO, Al 2 o 3 、TiO 2 ,P 2 o 5 , X-ray fluorescence spectroscopic analysis of TSi:

[0042] First, prepare standard glass beads:

[0043] 1. Weigh the aluminum standard sample containing silicon carbide and the mixed oxidant, put them into a porcelain crucible and mix.

[0044] 2. Weigh lithium tetraborate, put it into a platinum crucible, add 0.03-0.06g of ammonium iodide at the same time, melt at 1100°C for 5 minutes, take out the platinum crucible with lithium tetraborate as a wall-mounted bottom, and cool it for later use.

[0045] 3. Pour the mixture in the porcelain crucible into a platinum crucible with a lithium tetraborate wall-mounted backing.

[0046] 4. Put the platinum crucible containing the mixture into a high-temperature melting furnace, keep it warm for 5-10 minutes for every 50-70°C increase from 650°C until t...

Embodiment 2

[0053]Embodiment 2, adopt the present invention to the K in the refractory material containing silicon carbide silicon 2 O, Fe 2 o 3 , MnO, MgO, CaO, Al 2 o 3 、TiO 2 ,P 2 o 5 , X-ray fluorescence spectroscopic analysis of TSi:

[0054] First, prepare standard glass beads:

[0055] 1. Weigh the silicon carbide-containing silicon standard sample and the mixed oxidant, and mix them in a porcelain crucible.

[0056] 2. Weigh lithium tetraborate, put it into a platinum crucible, add 0.03-0.06g of ammonium iodide at the same time, melt at 1100°C for 5 minutes, take out the platinum crucible with lithium tetraborate as a wall-mounted bottom, and cool it for later use.

[0057] 3. Pour the mixture in the porcelain crucible into a platinum crucible with a lithium tetraborate wall-mounted backing.

[0058] 4. Put the platinum crucible containing the mixture into a high-temperature melting furnace, keep it warm for 5-10 minutes for every 50-70°C increase from 650°C until the tem...

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Abstract

This invention relates to one sampling method for X ray spectrum analysis of carbon silicon materials, which comprises the following steps: processing mixture of oxygen agent; processing fuse hanging bottom foil pot; pulling the mixture carbon silicon anti-fire materials sample ad mixture oxygen agent into the pot; putting the pot onto high temperature chamber for heating of oxidation in low temperature to process the glass rollers for the spectrum analysis for X ray.

Description

technical field [0001] The invention relates to a sample preparation method for X-ray spectroscopic analysis of silicon carbide-containing materials. Background technique [0002] X-ray fluorescence spectroscopy has the advantages of fast, simple, accurate, and high precision. With the development of instrument and software technology, how to make full use of the advantages of X-ray fluorescence spectroscopy and its sample preparation effect become the key points. The requirements for the sample to be analyzed are: smooth surface, no pollution, uniform element distribution, no particle effect and mineral effect, stable, and the physical form of the standard sample and the test sample must be consistent to ensure the accuracy of the analysis results. At present, there are mainly four sample preparation methods for X-ray fluorescence spectroscopic analysis: [0003] 1. Block sample method: such as cutting and polishing metal samples. [0004] 2. Powder tableting method: For ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N23/223
Inventor 陆晓明金德龙徐元财王伟敏缪虹
Owner BAOSHAN IRON & STEEL CO LTD
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