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267 results about "X-Ray Fluorescence Spectroscopy" patented technology

Iron alloy fusing sample preparation method for X-ray fluorescence spectrum analysis

The invention relates to an iron alloy fusing sample preparation method for X-ray fluorescence spectrum analysis, belonging to the technical field of materialization detection and aiming to solve the problem that fusing a film production alloy sample can erode a platinum crucible. The method comprises the steps of building up wall of the platinum crucible, preparing an oxidizing agent, pre-oxidizing an iron alloy sample and fusing and preparing sample from the iron alloy sample. The invention provides the fusing sample preparation method suitable for various iron alloys such as ferromanganese, silicomanganese, calcium silicon, ferrosilicon, ferromolybdenum, ferrotitanium, cymrite, ferrochrome, ferrocolumbium, ferrovanadium, silicon silicomanganese and the like. By adopting the method, a glass fusing piece can be manufactured without eroding the valuable platinum crucible, the sample can be completely oxidized in the sample preparation process, the sample preparation time is short, the prepared glass fusing piece is uniform and perfect, and the mineral effect and the granularity effect can be completely eliminated. The invention has safe and reliable method, simple and convenient operation and good repeatability, is suitable for various iron alloy samples and widens the application range of the fluorescence analysis.
Owner:HBIS COMPANY LIMITED HANDAN BRANCH COMPANY

Method for determining content of zinc in zinc concentrate through energy-dispersive X-ray fluorescence spectrometry

The invention discloses a method for determining the content of zinc in the zinc concentrate through energy-dispersive X-ray fluorescence spectrometry. The method comprises the following steps: 1, preparing a plurality of zinc-iron working liquids, converting the mass concentrations of Zn in the operating liquids to Zn mass percentage concentrations, detecting the Zn mass percentage concentrations with an energy-dispersive X-ray fluorescence spectrometer as a detector, recording the fluorescence intensity during each time injection of a sample, and making a working curve; and 2, processing the zinc concentrate as a sample to prepare a sample solution, injecting the sample solution under detection conditions for making the working curve, recording the fluorescence intensity displayed on the detector, reading out the Zn mass percentage concentration corresponded to the fluorescence intensity according to the determined working curve, and calculating according to a specific formula to obtain the mass percentage concentration of simple substance zinc in the sample. The method utilizes a solution process to eliminate or basically eliminate the matrix effect, so the zinc content can be accurately determined; and the method has the advantages of simple operation, short detection period, good detection result accuracy and high precision.
Owner:广西出入境检验检疫局危险品检测技术中心

X-ray fluorescence spectroscopy analysis fusion sample preparation method of aluminum, manganese, calcium and iron alloy

The invention discloses an X-ray fluorescence spectroscopy analysis fusion sample preparation method of an aluminum, manganese, calcium and iron alloy, which comprises the steps of: firstly, coating a uniform protection wall layer in a platinum crucible by using lithium tetraborate, then placing an aluminum, manganese, calcium and iron sample, an oxidizing agent, a lithium borate solvent and a releasing agent into the platinum crucible in which the protection wall is coated, uniformly mixing, and then pre-oxidizing the aluminum, manganese, calcium and iron sample; and finally, melting the pre-oxidized aluminum, manganese, calcium and iron sample, and cooling to obtain an aluminum, manganese, calcium and iron sample glass fuse piece, wherein the aluminum, manganese, calcium and iron sample is a detection sample or calibration sample of the aluminum, manganese, calcium and iron alloy, and the sample glass fuse piece is a detection sample glass fuse piece or calibration sample glass fuse piece of the aluminum, manganese, calcium and iron alloy. On the premise of no corrosion to the valuable platinum crucible, the glass fuse piece can be prepared, and the prepared sample is excellent and uniform, thus the mineral effect and the grain size effect are completely eliminated.
Owner:HBIS COMPANY LIMITED HANDAN BRANCH COMPANY

Sintered polycrystalline yttrium aluminum garnet and use thereof in optical devices

A transparent yttrium aluminum garnet precursor composition is provided that includes a plurality of calcined particles of yttrium aluminum oxide having a mean particle domain size of between 10 and 200 nanometers and a predominant hexagonal crystal structure. High levels of YAG transparency are obtained for large YAG articles through control of the aluminum:yttrium atomic ratio to 1:06±0.001 and limiting impurity loadings to less than 100 ppm. The composition is calcined at a temperature between 700° Celsius and 900° Celsius to remove organic additives to yield a predominant metastable hexagonal phase yttrium aluminum oxide nanoparticulate having an atomic ratio of aluminum: yttrium of 1:0.6±0.001. With dispersion in an organic binder and a translucent YAG article is formed having a transmittance at a wavelength of 1064 nanometers of greater than 75%. The translucent YAG article is characterized by an average domain size of less than 1 micron and having a density of at least 99% and inclusions present at less than 2 surface area percent. The ability of a batch of yttrium aluminum oxide nanoparticles to serve as a transparent YAG precursor includes collecting an X-ray fluorescence spectrum from a plurality of aluminum oxide nanoparticles having a predominant crystal structure other than garnet to yield an A1:Y raw integrated peak intensity ratio. The nanoparticles are sintered to yield a predominant garnet phase and a secondary phase and optionally isostatic pressing during sintering. By using only precursor nanoparticles with a standard deviation of ±0.003 in the peak ratio exceptionally high transparency YAG is reproducibly produced.
Owner:NANOCEROX

Metal alloy XRF spectrometry utilizing new sample preparation technology

InactiveCN102207475AHigh melting pointSolve the problem that cannot be detected by X-ray fluorescence spectroscopyMaterial analysis using wave/particle radiationPreparing sample for investigationCarbonizationAcid dissolution
The invention provides a metal alloy XRF spectrometry utilizing a new sample preparation technology. The technology comprises the following steps: 1) acid dissolution: dissolving a metal alloy with inorganic acid; 2) precipitation: adjusting the above dissolved sample solution to be alkaline to precipitate elements to be measured, and filtering the precipitation with ashless filter paper; 3) calcination: placing the filtered filter residues together with the filter paper in a porcelain crucible calcined to a constant weight, conversing the filter residues into metal oxides through steps of drying, carbonization, ashing, calcination, etc, and calculating a weight of calcined filter residues; 4) sheet melting: preparing the above calcined filter residues into a sample sheet by a fusion sample preparation method for detection by an XRF spectrometer, and obtaining contents of elements to be measured in the metal alloy through conversion of obtained data. The invention enables the XRF spectrometry to be applied to detections of some special metal alloys which have a high melting point, a high hardness and is easily oxidized.
Owner:INSPECTION & QUARANTINE TECH CENT OF XIAMEN ENTRY EXIT INSPECTION & QUARANTINE BUREAU

X-ray fluorescent spectrum fundamental parameter method utilizing virtually synthesized standard sample

InactiveCN104111263ASolve the problem of no standard samplesFast analysisMaterial analysis using wave/particle radiationLower limitSoft x ray
The invention relates to an X-ray fluorescent spectrum fundamental parameter method utilizing a virtually synthesized standard sample, belonging to the technical field of X-ray fluorescent spectrum detection. A standard sample is integrated with the fundamental parameter method; appropriate working conditions are selected; the comprehensive application such as effective overlap and correction of spectral lines, background deduction and the like is carried out, so that pure strength values of all elements can be obtained; subsequently a standard sample is virtually synthesized, so that a fundamental parameter method curve manufactured by the virtually synthesized standard sample is established; finally a user can establish a general working curve of the same substrate material by using a few standard samples, so that the accurate detection of components of alloys of the same substrate can be achieved; the fundamental parameter method has a wide analysis range and is not limited by an upper limit and a lower limit of the standard sample; a great quantity of standard samples are not required to be purchased, so that the fundamental parameter method has great economic benefits. The X-ray fluorescent spectrum fundamental parameter method is also applicable to detection of the novel material and capable of meeting detection of novel materials which are developed by research institutions of colleges and universities and the like, and solves the problem of no standard sample of the novel material. The method is wide in application prospect in detection field of X-ray fluorescence spectrophotometers.
Owner:DALIAN UNIV OF TECH +4

Method for preparing standard sample for testing content of hard-alloy components and method for testing content of hard-alloy components

The invention discloses a method for preparing a standard sample for testing the content of hard-alloy components by adopting the X-ray fluorescence spectrometry and a method for testing the content of hard-alloy components by adopting the X-ray fluorescence spectrometry. The method for preparing the standard sample comprises the following steps: preparing a variety of high-purity single oxide glass fuse pieces under the same condition of preparing glass fuse pieces of the sample under test; grinding the high-purity single oxide glass fuse pieces into powder and filling the powder into bottles respectively; weighting the powder of the high-purity single oxide glass fuse pieces, which comprises a variety of elements under test in the sample under test, to prepare the standard sample, wherein the range of the content of a variety of elements of the standard sample covers the range of the content of a variety of elements of the sample under test; and finally preparing the glass fuse pieces of the standard sample according to the method. A working curve is made by using the glass fuse pieces of the standard sample, and then the content of a variety of elements of the hard alloy sample under test are tested by adopting the X-ray fluorescence spectrometry. Due to the adoption of the standard sample prepared by using the method of the invention, the limit to the detection method of the hard alloy, which is caused by the standard sample, can be eliminated, the accuracy of the result can be improved, and the application range of the X-ray fluorescence spectrometry can be expanded.
Owner:PANZHIHUA IRON & STEEL RES INST OF PANGANG GROUP

Method for analyzing ferrosilicon alloy components for X-ray fluorescence spectrum analysis

The invention discloses a method for analyzing ferrosilicon alloy components for X-ray fluorescence spectrum analysis. A method for preparing a sample comprises the following steps of: selecting a proper oxidant; adding a flux into a platinum crucible, putting the platinum crucible in a high temperature furnace, and melting the flux at high temperature to manufacture a wall built-up flux crucible with the basement of flux; mixing a ferrosilicon alloy test sample, the flux and the oxidant, pouring the mixture into the flux crucible, and covering a certain amount of mixed flux; and putting the flux crucible filled with the ferrosilicon alloy test sample, the flux, the oxidant and the mixed flux into the high temperature furnace, preliminarily oxidizing at low temperature, shifting into a high temperature zone, and melting at high temperature to prepare the ferrosilicon alloy test sample glass sample for the X-ray fluorescence spectrum analysis. In the technical scheme, elements are uniformly distributed in the prepared glass sample, and the glass sample has no particle effect and can be preserved for a long time; moreover, the operation method is simple and safe, the preparation time of the sample is short, and primary and secondary quantity elements in the ferrosilicon alloy are rapidly and accurately measured.
Owner:MAANSHAN IRON & STEEL CO LTD

Method for detecting content of carborundum impurities by applying X-ray fluorescent spectrometry

The invention relates to a method for detecting the content of carborundum impurities by applying an X-ray fluorescent spectrometry, comprising the following steps of: firstly, preparing a test sample wafer; secondly, preparing a standard sample wafer: (1) purifying a sample of carborundum; (2) purifying the carborundum to prepare puried carborundum; and (3) artificially preparing a standard sample and finally pressing the standard sample into a standard carborundum sample wafer; thirdly, establishing a working curve of the X-ray fluorescent spectrometry by the standard sample wafer; and fourthly, placing the prepared test sample wafer in an X-ray fluorescent spectrograph, measuring the sample wafer by the established working curve and automatically calculating the contents of various elements in the sample. By adopting the method, the workload for preparing standard series can be greatly reduced and the accuracy and the speed for preparation can be improved, thereby avoiding the defects of the traditional method for detecting the carborundum. The method is concise and rapid, meets the requirement of trade development, has great generalization and application values, and can be widely suitable for testing various samples by the X-ray fluorescent spectrum.
Owner:CHEM MINERALS & METALLIC MATERIALS INSPECTION CENT OF TIANJIN ENTRY EXIT INSPECTION & QUARANTINE BUREAU

Melted sampling method for aluminum magnesium calcium iron alloy for X-ray fluorescence spectrum analysis

The invention discloses a melted sampling method for aluminum magnesium calcium iron alloy for X-ray fluorescence spectrum analysis. The melted sampling method is characterized by comprising the following steps of: hanging a layer of uniform lithium tetraborate protective wall in a platinum crucible; putting an aluminum magnesium calcium iron sample, lithium carbonate and potassium iodide into the platinum crucible in which the protective wall is hung, mixing uniformly, and covering a layer of lithium tetraborate; pre-oxidizing the aluminum magnesium calcium iron sample; and melting the oxidized aluminum magnesium calcium iron sample, and cooling to obtain a glass fuse piece of the aluminum magnesium calcium iron alloy. By the method, the sampling time is short, the manufactured glass fuse piece is uniform and perfect, and the specification of a mineral effect and a granularity effect can be eliminated completely. The glass fuse piece can be used for the X-ray fluorescence spectrum analysis, the obtained analytic result is accurate and reliable, and the requirements of modern enterprises on quick and accurate detection of analytic data are met. The method is safe, reliable, easy to operate and high in repeatability, and the application range of an X-ray fluorescence spectrum method is broadened.
Owner:HBIS COMPANY LIMITED HANDAN BRANCH COMPANY

Method for analyzing vanadium iron ingredients by melt smelting sampling-X-ray fluorescence spectrum process

The invention belongs to the technical field of the detection of vanadium iron, and particularly relates to a method for analyzing vanadium iron ingredients by a melt smelting sampling-X-ray fluorescence spectrum process. The method comprises the following steps of: (1) in a low-content calibration standard sample, mixing a vanadiumiron guide sample and pure iron powder, smelting under vacuum, casting for forming, measuring by using an X-ray fluorescence spectrograph, measuring the strength of a high-content calibration standard sample on the X-ray fluorescence spectrograph, crushing, analyzing a constant value by a wet process, and establishing a standard curve for each calibration standard sample, wherein the high-content calibration standard sample is a vanadium iron sample with different ingredient content gradients; and (2) taking a vanadium iron melt in a smelting electric furnace, casting to form blocks, polishing, measuring by using the X-ray fluorescence spectrograph, and calculating the content of each element in vanadium iron according to the standard curve drawn in the step (1). By the method, analytical information can be fed back within 10 minutes, so the method has the characteristics of high speed, high efficiency, low cost, safety and environment friendliness, and is suitable for quick and on-spot analysis of a ferroalloy smelting furnace.
Owner:PANGANG GRP PANZHIHUA STEEL & VANADIUM

Preparation method of ferroalloy calibration samples for X-ray fluorescence spectrum analysis

InactiveCN102818722ASolving No Standard SamplesSolve the problem of insufficient standard samplesMaterial analysis using wave/particle radiationPreparing sample for investigationX-rayAlloy
The invention discloses a preparation method of ferroalloy calibration samples for X-ray fluorescence spectrum analysis. The preparation method is characterized in that firstly, high-pure metal and/or standard reagents are weighed according to the alloy proportioning, then, the high-pure metal and/or standard reagents are dissolved into solution by solvents, next, the solution is quantificationally transferred into a platinum yellow crucible and is melted after being mixed with lithium borate, oxidants and release agents, the cooling is carried out, and a ferroalloy calibration sample glass fuse piece is obtained. The method has the advantages that the ferroalloy calibration samples to be measured are compounded by reference or standard substances with similar element composition and content range, and the problem of no ferroalloy standard sample to be measured or standard sample insufficiency is solved. The ferroalloy calibration sample glass fuse piece obtained by the method is used for the X-ray fluorescence spectrum analysis, the result is accurate and reliable, and the application range of an X-ray fluorescence spectrum analysis method is expanded.
Owner:HBIS COMPANY LIMITED HANDAN BRANCH COMPANY

Method for correcting overlap of X ray fluorescent spectroscopy spectral lines

InactiveCN102128851AReduce usageSimplified Overlap Intensity Correction MethodMaterial analysis using wave/particle radiationX-raySpectroscopy
The invention discloses a method for correcting overlap of X ray fluorescent spectroscopy spectral lines. The method comprises the following steps of: (1) overlapping a YKa spectral line of a Y element with an XLa spectral line of an X element, wherein the real intensity I1<Y> of the YKa spectral line of the Y element is equal to I<Y> measured-I1<X>; (2) selecting a standard sample which contains the Y element and does not contain the X element and establishing a calibration curve according to the percentage composition Wi of the Y element and the measured real total fluorescent intensity Ii of the Y element, wherein a calibration curve formula is that: Wi=a*Ii+bY, and the element sensitivity M=1/a; (3) with respect to of the standard sample which contains the Y element and does not contain the X element, calculating the XLa overlap fluorescent intensity I1<X>=K*IXKA=M*C at the YKa, wherein a spectral line overlap correction coefficient K=I<Y> measured-M*c/IXKA; and (4) measuring the fluorescent intensity of the corrected spectral line of the Y element, wherein the fluorescent intensity is real intensity I1<Y>=I<Y> measured-K*IXKA. The method has the advantages of lowering production test cost and simplifying a spectral line overlap intensity correction method.
Owner:SHENYANG AIRCRAFT CORP

Well Plate

The present invention includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays. The present invention also includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered on one side of the plate by a detachable cover forming a water-tight seal against the plate. The cover is substantially free of the elements osmium, yttrium, iridium, phosphorus, zirconium, platinum, gold, niobium, mercury, thallium, molybdenum, sulfur, lead, bismuth, technetium, ruthenium, chlorine, rhodium, palladium, argon, silver, and thorium. The holes are less than about 500 micrometers across in one dimension where the cover covers the holes. The present invention also includes a method for preparing samples for measurement by x-ray fluorescence spectrometry. The method comprises providing a solution of with less than 10 micromolar solute and a volume of between about 2 microliters and about 2 milliliters. The solution is concentrated and analyzed using x-ray fluorescence spectrometry.
Owner:ICAGEN LLC
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