Method for correcting overlap of X ray fluorescent spectroscopy spectral lines

A technology of ray fluorescence spectroscopy and spectral line analysis, which is applied in the direction of material analysis, material analysis, and measuring devices using wave/particle radiation, and can solve the problem of difficult to obtain pure metals, unavailable spectral line overlap correction coefficients, and expensive pure metals and other problems, to achieve the effect of simplifying the calibration method, reducing the cost of production and testing, and improving the range of applicable alloys

Inactive Publication Date: 2011-07-20
SHENYANG AIRCRAFT CORP
View PDF5 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The problems and deficiencies of this method are as follows: ① It is difficult to obtain pure metals from some elements in practical applications, and the available pure metals are also relatively expensive
②The pure element method to measure the spectral lin

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for correcting overlap of X ray fluorescent spectroscopy spectral lines

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0048] Quantitative analysis method of phosphorus P element in steel, when measuring phosphorus element in steel, first by calculating M O The spectral line overlap correction coefficient K of element to phosphorus P element, and then apply the spectral line overlap correction coefficient K to measure the true fluorescence intensity of phosphorus P element, and use the fundamental parameter (FP) method to establish a standard working curve.

[0049] ① Instruments and working conditions

[0050] Instrument: XRF-1800 X-ray fluorescence spectrometer (Shimadzu Corporation, Japan)

[0051] Working conditions: X-ray tube is rhodium target X-ray tube; X-ray tube power is 4KW; instrument temperature is 35±0.5°C; vacuum atmosphere is less than 15 Pa; argon methane gas flow is 113.0 Kpa; internal circulation water conductivity is 0.07 uS ;The working mode is sample box rotation.

[0052] ② Standard samples and sample products

[0053] The standard samples are standard samples for spe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for correcting overlap of X ray fluorescent spectroscopy spectral lines. The method comprises the following steps of: (1) overlapping a YKa spectral line of a Y element with an XLa spectral line of an X element, wherein the real intensity I1<Y> of the YKa spectral line of the Y element is equal to I<Y> measured-I1<X>; (2) selecting a standard sample which contains the Y element and does not contain the X element and establishing a calibration curve according to the percentage composition Wi of the Y element and the measured real total fluorescent intensity Ii of the Y element, wherein a calibration curve formula is that: Wi=a*Ii+bY, and the element sensitivity M=1/a; (3) with respect to of the standard sample which contains the Y element and does not contain the X element, calculating the XLa overlap fluorescent intensity I1<X>=K*IXKA=M*C at the YKa, wherein a spectral line overlap correction coefficient K=I<Y> measured-M*c/IXKA; and (4) measuring the fluorescent intensity of the corrected spectral line of the Y element, wherein the fluorescent intensity is real intensity I1<Y>=I<Y> measured-K*IXKA. The method has the advantages of lowering production test cost and simplifying a spectral line overlap intensity correction method.

Description

technical field [0001] The invention is used for X-ray fluorescence spectroscopic analysis spectral line overlap correction. Background technique [0002] Line overlap and matrix effect are the two main factors that affect the accuracy of X-ray fluorescence spectroscopy. When the fundamental parameter (FP) is used to correct the matrix effect, the intensity of line overlap must be corrected first to obtain the true fluorescence intensity. The existing spectral line overlap intensity correction is to measure the spectral line overlap correction coefficient with the pure element method, and then apply the spectral line overlap correction coefficient to calculate the real fluorescence intensity. The problems and deficiencies of this method are as follows: ① It is difficult to obtain pure metals from some elements in practical applications, and the available pure metals are also relatively expensive. ②The method of measuring spectral line overlap correction coefficient by pure ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N23/223
Inventor 刘海东
Owner SHENYANG AIRCRAFT CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap