Method for analyzing ferrosilicon alloy components for X-ray fluorescence spectrum analysis
A technology of ferrosilicon alloy and analysis method, which is applied in the direction of material analysis, analysis materials, and test sample preparation using wave/particle radiation, and can solve the problems of long-term storage of standard samples and samples, adverse effects of instruments, and environmental pollution. , achieve the effect of shortening the detection cycle, short preparation time, and no particle effect
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[0028] The specific implementation manners of the present invention will be further described in detail below, so as to help those skilled in the art have a more complete, accurate and in-depth understanding of the inventive concepts and technical solutions of the present invention.
[0029] The invention relates to an analysis method for X-ray fluorescence spectroscopic analysis of ferrosilicon alloy components, and the analysis method includes a method for preparing samples of ferrosilicon alloy test samples.
[0030] In order to solve the problems existing in the current known technology described in the background technology section of this specification and overcome its defects, and realize the purpose of the invention that the elements in the prepared glass sample are evenly distributed, have no particle effect, and can be stored for a long time, the technology adopted in the present invention The scheme is:
[0031] The analytical method for X-ray fluorescence spectrosc...
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