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Method for analyzing ferrosilicon alloy components for X-ray fluorescence spectrum analysis

A technology of ferrosilicon alloy and analysis method, which is applied in the direction of material analysis, analysis materials, and test sample preparation using wave/particle radiation, and can solve the problems of long-term storage of standard samples and samples, adverse effects of instruments, and environmental pollution. , achieve the effect of shortening the detection cycle, short preparation time, and no particle effect

Inactive Publication Date: 2011-08-17
MAANSHAN IRON & STEEL CO LTD
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Problems solved by technology

The advantage of this method is that it can effectively overcome particle effects and mineral effects, and the elements are evenly distributed, but its disadvantages are that liquid leakage is prone to occur, which will have adverse effects on the instrument, and it is difficult to store standards and samples for a long time, and because a large amount of acid and alkali is used, easy to pollute the environment

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  • Method for analyzing ferrosilicon alloy components for X-ray fluorescence spectrum analysis

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Embodiment Construction

[0028] The specific implementation manners of the present invention will be further described in detail below, so as to help those skilled in the art have a more complete, accurate and in-depth understanding of the inventive concepts and technical solutions of the present invention.

[0029] The invention relates to an analysis method for X-ray fluorescence spectroscopic analysis of ferrosilicon alloy components, and the analysis method includes a method for preparing samples of ferrosilicon alloy test samples.

[0030] In order to solve the problems existing in the current known technology described in the background technology section of this specification and overcome its defects, and realize the purpose of the invention that the elements in the prepared glass sample are evenly distributed, have no particle effect, and can be stored for a long time, the technology adopted in the present invention The scheme is:

[0031] The analytical method for X-ray fluorescence spectrosc...

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Abstract

The invention discloses a method for analyzing ferrosilicon alloy components for X-ray fluorescence spectrum analysis. A method for preparing a sample comprises the following steps of: selecting a proper oxidant; adding a flux into a platinum crucible, putting the platinum crucible in a high temperature furnace, and melting the flux at high temperature to manufacture a wall built-up flux crucible with the basement of flux; mixing a ferrosilicon alloy test sample, the flux and the oxidant, pouring the mixture into the flux crucible, and covering a certain amount of mixed flux; and putting the flux crucible filled with the ferrosilicon alloy test sample, the flux, the oxidant and the mixed flux into the high temperature furnace, preliminarily oxidizing at low temperature, shifting into a high temperature zone, and melting at high temperature to prepare the ferrosilicon alloy test sample glass sample for the X-ray fluorescence spectrum analysis. In the technical scheme, elements are uniformly distributed in the prepared glass sample, and the glass sample has no particle effect and can be preserved for a long time; moreover, the operation method is simple and safe, the preparation time of the sample is short, and primary and secondary quantity elements in the ferrosilicon alloy are rapidly and accurately measured.

Description

technical field [0001] The invention belongs to the technical field of iron and steel industry production, and relates to an analysis method for ferrosilicon alloy components, more specifically, the invention relates to an analysis method for X-ray fluorescence spectrum analysis of ferrosilicon alloy components. Background technique [0002] Ferrosilicon alloy is an alloy of silicon and iron. It is a good deoxidizer and is mainly used in steelmaking and casting as a deoxidizer or an additive for alloying elements. Silica, steel shavings, and coke are the main raw materials for producing ferrosilicon. [0003] At present, chemical analysis is usually used for the analysis of ferrosilicon alloy components. Due to its very high silicon content, sample dissolution procedures are complicated during the experiment, the analysis cycle is long, the labor intensity of analysts is high, the consumption of reagents is large, and the reagents used are easy to cause environmental damage....

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N23/223
Inventor 宋祖峰程坚平牟新玉
Owner MAANSHAN IRON & STEEL CO LTD
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