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126 results about "Spectral pattern" patented technology

Evaluation method of semiconductor layer, method for fabricating semiconductor device, and storage medium

PCT No. PCT/JP98/02567 Sec. 371 Date Jan. 13, 1999 Sec. 102(e) Date Jan. 13, 1999 PCT Filed Jun. 10, 1998 PCT Pub. No. WO98/57146 PCT Pub. Date Dec. 17, 1998Measurement light, which has been emitted from a Xe light source (20) and then linearly polarized by a polarizer (21), is made to be incident at a tilt angle on a region in a silicon substrate (11) with crystallinity disordered by the implantation of dopant ions. And the spectra of cos DELTA and tan psi are measured with a variation of the measurement light, where DELTA is a phase difference between respective components in p and s directions as to the light reflected as an elliptically-polarized ray, and psi is a ratio between the amplitudes of these components. By correlating in advance the spectral patterns of cos DELTA and so on with the thickness of an amorphous region through a destructive test or the like, or by paying special attention to characteristic parts of the patterns of cos DELTA and so on, the thickness or the degree of disordered crystallinity of the amorphous region is estimated. Also, since a variation in the thickness of the amorphous region can be identified based on a variation of cos DELTA before and after a heat treatment, a temperature of the heat treatment can be sensed based on the variation of the thickness. Thus, an evaluation method allowing for nondestructive estimation of the thickness and the degree of disorder of a region, having crystallinity disordered by implanting dopant ions into a semiconductor region at a high level, can be provided.
Owner:PANASONIC CORP

Magnetic resonance spectroscopy with real-time correction of motion and frequency drift, and real-time shimming

This invention relates to localized magnetic resonance spectroscopy (MRS) and to magnetic resonance spectroscopic imaging (MRSI) of the proton NMR signal, specifically to a magnetic resonance spectroscopy (MRS) method to measure a single volume of interest and to a magnetic resonance spectroscopic imaging method with at least one spectral dimension and up to three spatial dimensions. MRS and MRSI are sensitive to movement of the object to be imaged and to frequency drifts during the scan that may arise from scanner instability, field drift, respiration, and shim coil heating due to gradient switching. Inter-scan and intra-scan movement leads to line broadening and changes in spectral pattern secondary to changes in partial volume effects in localized MRS. In MRSI movement leads to ghosting artifacts across the entire spectroscopic image. For both MRS an MRSI movement changes the magnetic field inhomogeneity, which requires dynamic reshimming. Frequency drifts in MRS and MRSI degrade water suppression, prevent coherent signal averaging over the time course of the scan and interfere with gradient encoding, thus leading to a loss in localization. It is desirable to measure object movement and frequency drift and to correct object motion and frequency drift without interfering with the MRS and MRSI data acquisition.
Owner:POSSE STEFAN

Wavelength calibration method of optical spectrum instruments

A wavelength calibration method of spectral instrumentation mainly relating to wave length calibration method adopting spectral instrumentation of array detector pertains to the filed of wave length calibration technology of spectral instrumentation. The spectral instrumentation of the method adopts array detectors and lighting source of linear spectra, spatial locations of every spectrum peak of the lighting source are acquired from the spectrogram output from the instrumentation, and the 'spatial location - wave-length relationship' on the power spectrum is fitted by according these spectrum peak wavelength and the corresponding spatial locations thereof, thus corresponding wavelength of every pixel of the detector is confirmed, the spatial locations of every spectrum peak of the lighting source is acquired through processes as following: sub-pixel detecting; sub-pixel reestablishing; spectrum peak spatial locations acquiring. The sub-pixel detecting of the invention increases sampling ratio of spectrogram, spectrogram with improved resolution in acquired; the comprehensive applications of sub-pixel detecting, sub-pixel reestablishing and spectrum contour fitting further increases the wavelength accuracy of spectral instrumentation with array detectors step by step. The invention has prominent effect.
Owner:TSINGHUA UNIV

Rapid prediction method and system for exterior noise of high-speed train

The invention discloses a fast prediction method and a system for external noise of a high-speed train, The method comprises the following steps: dividing the surface of a high-speed train into a plurality of regions, simplifying the sound sources in different regions into compact point sound sources, calculating the radiation sound pressure level of each compact point sound source, and establishing an energy superposition model of radiation sound pressure levels of a plurality of compact point sound sources; According to the marshalling and actual size data of the high-speed train, the real vehicle sound source imaging test is carried out, and the noise curves of each compact point sound source under different speed levels are obtained. According to the noise curves of each compact pointsource, the spectral patterns of multiple compact point sources are fitted, and the noise spectral pattern fitting coefficients of different regions at different velocity levels are obtained. According to the fitting coefficients and the energy superposition model, the radiated noise of the high-speed train at different speed levels and the whole vehicle at the distance from the track is calculated. The present invention provides a quick assessment of the impact on the overall noise characteristics.
Owner:CENT SOUTH UNIV

Establishment of levofloxacin-induced Shigella drug-resistance gene mutation time sequence models

The invention relates to establishment of levofloxacin-induced Shigella drug-resistance gene mutation time sequence models. The establishment method comprises the following main steps: 1, carrying out drug sensitive tests of 12 antibiotics such as levofloxacin and the like on Shigella, and selecting sensitive strains to carry out an induction experiment; 2, detecting MIC0 of levofloxacin on the primary induction strain; 3, inoculating the single colony into a levofloxacin bacterial liquid culture medium to culture; and 4, taking the bacterial solution in the step 3, transferring to the levofloxacin bacterial liquid culture medium to passage the one generation, taking the obtained bacterial solution, transferring to a levofloxacin liquid culture medium to passage the two generations, sequentially carrying out levofloxacin concentration multiplication culture of bacterial before the drug concentration achieves the sensitive and medium critical value, sequentially carrying out levofloxacin concentration increase culture after the drug concentration achieves the sensitive and medium critical value, carrying out induction culture on the strain for 2 days at the concentration when the induced anti-bacterial drug concentration achieves 2, 4 and 8 mug/ml, carrying out induction culture on the well-growing single colony to obtain the induced Shigella drug-resistance spectral pattern, and carrying out mutation analysis on the induced drug-resistance spectral pattern strain.
Owner:ZHENGZHOU UNIV
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