Thin film characteristic measuring device
A technology for measuring device and thin film characteristics, applied in the field of thin film characteristics measuring device, which can solve the problems that sensors are easily affected by moisture or additives, and difficult to manage in operation or maintenance.
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[0042] Now, the present invention will be described in detail with reference to the accompanying drawings. 1A and 1B are diagrams showing an embodiment of a thin film characteristic measuring device of the present invention. Where those elements that are the same as those of the related art device described in FIG. 6 are denoted by the same reference numerals, description thereof will be omitted here.
[0043] In FIGS. 1A and 1B, reference numeral 20 refers to an orientation meter placed in the middle of the ring die 2 and the press roll 5, next to the peripheral portion of the cylindrical blown film 3a, and the orientation meter is placed along the direction of the figure. The ring member, not shown in FIG. 1B, rotates in the circumferential direction indicated by the arrow in FIG. 1B.
[0044] That is, for example, the orientation meter repeats the following operations: from point A as a starting point, rotates about half a circle in the direction of arrow B; A rotates abo...
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