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Thin film characteristic measuring device

A technology for measuring device and thin film characteristics, applied in the field of thin film characteristics measuring device, which can solve the problems that sensors are easily affected by moisture or additives, and difficult to manage in operation or maintenance.

Inactive Publication Date: 2007-11-14
YOKOGAWA ELECTRIC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] In addition, considering the use of a driving machine to measure the thickness of a sheet (before folding) of the cylindrical film portion, however, when backscattering of gamma rays is used as a radiation source, since it is an RI radiation source, it is difficult to operate or maintain Difficult to manage
[0014] In addition, when using an electrostatic capacitance type sensor, there is a difficulty that the sensor is easily affected by moisture or additives, etc.

Method used

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Embodiment Construction

[0042] Now, the present invention will be described in detail with reference to the accompanying drawings. 1A and 1B are diagrams showing an embodiment of a thin film characteristic measuring device of the present invention. Where those elements that are the same as those of the related art device described in FIG. 6 are denoted by the same reference numerals, description thereof will be omitted here.

[0043] In FIGS. 1A and 1B, reference numeral 20 refers to an orientation meter placed in the middle of the ring die 2 and the press roll 5, next to the peripheral portion of the cylindrical blown film 3a, and the orientation meter is placed along the direction of the figure. The ring member, not shown in FIG. 1B, rotates in the circumferential direction indicated by the arrow in FIG. 1B.

[0044] That is, for example, the orientation meter repeats the following operations: from point A as a starting point, rotates about half a circle in the direction of arrow B; A rotates abo...

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Abstract

A character measuring device of thin film includes: a measuring unit, which is used to measure the degree and angle of the orientation in the circumference direction of the thin film; and configuration generating part, which is used to at least generate one in the orientation configuration and thickness configuration of the tubular thin film according to the signal that comes from the measuring unit.

Description

[0001] This application claims the benefit of foreign priority from Japanese Patent Application No. 2006-133196 filed May 12, 2006; the entire contents of which are incorporated herein by reference. technical field [0002] The present invention is applied to, for example, an inflation apparatus for forming a hollow blown film, or a cast film forming apparatus for forming a sheet film. More particularly, the present invention relates to an inflation apparatus or cast film forming apparatus which forms a sheet having a uniform thickness by controlling the orientation characteristics of a blown film or a cast film. Background technique [0003] Fig. 6 is a basic structural diagram of the inflatable device. In Fig. 6, plastic raw material extruded from an extruder 1 is formed into a cylindrical sheet 3a (blown film) through an annular die 2. Number 4 is an air supply / exhaust device. [0004] The cylindrical sheet is folded by pressing rollers 5 . The sheet 3b (blown film), f...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06G01B11/00G01B21/08B29C48/10B29C48/92
CPCB29C2947/92647B29C47/0057B29C47/92B29C2947/92152B29C2947/92428B29C2947/92076B29C47/28B29C2947/92409B29C47/20B29C47/0026B29C2947/92923G01B21/08B29C2947/92209B29C47/0059G01N2021/8416G01N21/86B29C48/92B29C2948/92209B29C2948/92409B29C48/10B29C48/0018B29C48/0019B29C48/32B29C48/34B29C2948/92076B29C2948/92152B29C2948/92428B29C2948/92647B29C2948/92923
Inventor 大日方祐彦佐佐木尚史
Owner YOKOGAWA ELECTRIC CORP