Reflexion type near-field Raman spectrometer instrument head

A Raman spectrometer and Raman spectroscopy technology are applied in the design field of the measuring head of a reflection type near-field Raman spectrometer, which can solve the problems of difficulty in building and adjusting, measuring near-field Raman spectral signals, etc., so as to improve the signal-to-noise ratio and the Effects of detection sensitivity, enhancement of excitation efficiency and collection efficiency

Inactive Publication Date: 2007-12-05
TSINGHUA UNIV
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Problems solved by technology

[0004] The purpose of the present invention is to overcome the shortcomings that the existing near-field Raman spectrometer cannot measure the near-field Raman spectrum signal by arbitrary angle excitation / arbitrary angle collection, and is difficult to build and adjust, and proposes a reflective near-field Raman spectrometer to measure head

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  • Reflexion type near-field Raman spectrometer instrument head
  • Reflexion type near-field Raman spectrometer instrument head
  • Reflexion type near-field Raman spectrometer instrument head

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Embodiment Construction

[0020] Two typical embodiments of the present invention will be described in detail below with reference to the accompanying drawings, but the present invention is not limited to these embodiments.

[0021] The optical path schematic diagram of Embodiment 1 of the present invention is as shown in Figure 1, and the shell 1 of described reflective near-field Raman spectrometer measuring head is cylindrical barrel shape, and 6 input or output optical interfaces (by mark) are arranged on the top of measuring head 2 to 7). The measuring head includes a cantilever-type non-aperture metal nanoprobe 8, a diode laser 19 and a four-quadrant photodetector 23 for measuring and controlling the near-field distance between the probe 8 and the sample 17 to be measured; The first condenser lens 9 , the second condenser lens 10 , the third condenser lens 11 , the first plane reflector 12 and the second plane reflector 13 in the collecting light path. The cantilever non-aperture metal nanoprobe...

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Abstract

The invention discloses a reflected near-field Lamen spectrometer measuring head based on local field reinforcing elementary of metal nanometer probe in the near-field optical, spectrum analytical detector technical domain, which is characterized by the following: adjusting the incidence angle of the excited light and the collecting angle of near-field Lamen spectrum signal; collecting the near-field Lamen spectrum signal from different directions; realizing multiple measuring patterns; improving the exciting efficiency and collecting efficiency of near-field Lamen spectrum signal effectively as well as the signal-to-noise ratio and detecting sensitivity; obtaining the nanometer size shape image, hyper-diffraction resolution near-field Lamen spectrum and near-field Lamen spectrum image simultaneously. adopting paralleling beam interface to combine with each kind of Lamen spectrometer or commercial Lamen spectrometer; fitting for dielectric size study in the biological, medical, chemical, physical and material domains widely.

Description

technical field [0001] The invention belongs to the technical fields of nano optics, near-field optics, and spectral analysis testing instruments, and in particular relates to the design of a measuring head of a reflective near-field Raman spectrometer. Background technique [0002] The near-field Raman spectrometer can realize the measurement of local Raman spectral signals at the nanoscale of samples, and perform chemical detection and analysis of nanoscale structures. It is an urgently needed instrument for the development of nanotechnology and the industrialization of nanotechnology. [0003] For the measurement of weak near-field Raman spectroscopy signals, it is extremely important to improve the excitation and collection efficiency. Near-field Raman spectroscopy based on tip enhancement is the most promising mainstream technology currently developed. The current experimental system is usually a transmission measurement system for the measurement of transparent sample...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65
Inventor 王佳许吉英吴晓斌王瑞王阳田芊
Owner TSINGHUA UNIV
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