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Automatic testing method and system of TDSCDMA integrated module to digital interface

A technology of digital interface and connection, applied in the field of production automation test of TDSCDMA integrated module, which can solve the problem of test quality being affected by human factors, etc.

Inactive Publication Date: 2008-02-06
深圳市虹远通信有限责任公司
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

If the TDSCDMA integrated module is produced and tested according to the current manual test method, it will take 2-3 times the time to test the 2G module, and the test quality is affected by human factors

Method used

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  • Automatic testing method and system of TDSCDMA integrated module to digital interface
  • Automatic testing method and system of TDSCDMA integrated module to digital interface
  • Automatic testing method and system of TDSCDMA integrated module to digital interface

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Embodiment Construction

[0018] In order to make the solution of the present invention clearer, the present invention will be further described in detail below in conjunction with examples. The TDSCDMA signal source and spectrum analyzer used in the specific embodiment of the present invention are respectively: Agilent4438C and Agilent4445.

[0019] Fig. 1, Fig. 2 are TDSCDMA5ms frame structure. The downlink pilot time slot DPTS and the uplink pilot time slot UPTS are special time slots (in addition there is a guard time slot GP not marked between DPTS and UPTS). TS0~TS6 are business time slots, TS0 is always assigned to the downlink, and TS1 is always assigned to the uplink. Figure 1 is the configuration waveform of the TDSCDMA frame time slot required for downlink testing. TS0, DPTS, TS4, TS5, and TS6 marked in dark are used time slots. Figure 2 shows the configuration waveform of the TDSCDMA frame time slot required for uplink testing. UPTS, TS1, TS2, and TS3 marked in dark are used time slots....

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Abstract

The present invention relates to an automatic test method and system aiming at TDSCDMA integrated module of digital interface. The test method comprises the following stesp: a. a host computer controls TDSCDMA signal source and a frequency spectrograph through GPIB bus; b. the host computer controls the TDSCDMA integrated module and a radio-frequency matrix switch through 485 bus; c. the host computer finishes the main radio-frequency index test of the TDSCDMA integrated module according to the text process; the host computer adjusts the best parameter of the TDSCDMA integrated module according to the test condition. By utilizing the automatic test method of the invention instead of the fussy manual test, the producing test time of the TDSCDMA integrated module is shortened, while productivity and efficiency of the enterprise are improved. The test result will not be affected by human factors with steady quality.

Description

technical field [0001] The invention relates to an automatic test method in TDSCDMA communication, in particular to a production automatic test method for TDSCDMA integrated modules. Background technique [0002] TDSCDMA is one of the third-generation mobile communication air interface technical specifications officially released by the International Telecommunication Union ITU. TDSCDMA integrated module is a kind of equipment widely used in the construction of TDSCDMA network, especially TDSCDMA repeater. [0003] Because the technical specifications of TDSCDMA are relatively complicated, the production and testing aspects of the integrated module are also complicated. It is mainly reflected in the frequent switching of various test modes and the increase of test index items. In the TDSCDMA mode, the operation of the signal source and the spectrum analyzer is complex and the number of keystrokes is large, and there are a lot of information and data to be read, and the upli...

Claims

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Application Information

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IPC IPC(8): H04B17/00H04Q7/34H04J13/02H04B17/309
Inventor 林巍刘道生余华安
Owner 深圳市虹远通信有限责任公司
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