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System and method for testing image sensing wafer stain and

An image sensing and stain detection technology, applied in measurement devices, image communication, optical testing flaws/defects, etc., can solve the problems of large subjective factors of detection methods and lower detection qualification rate, so as to improve the detection qualification rate and avoid subjective factors, the effect of overcoming the effects of noise

Inactive Publication Date: 2011-08-10
FOSHAN PREMIER SCI & TECH CO LTD +1
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Problems solved by technology

[0003] At present, in the process of assembling image sensing chips, the detection of image sensing chips is mainly through manual visual inspection, that is, manually picking out image sensing chips with stains on the imaging surface one by one. Subjective factors, and there will be a large missed detection rate in the manual detection method, which will reduce the detection pass rate

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  • System and method for testing image sensing wafer stain and
  • System and method for testing image sensing wafer stain and
  • System and method for testing image sensing wafer stain and

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Embodiment Construction

[0015] In order to further illustrate the present invention, a preferred embodiment is given and described in detail below with accompanying drawings.

[0016] like figure 1 Shown is a hardware architecture diagram of a preferred embodiment of the image sensing wafer stain testing system of the present invention. The image sensing wafer stain testing system (hereinafter referred to as “the system”) is built in a plurality of computers 2 . The computer 2 is electrically connected to an image sensing chip 10 to obtain an image through an image data line 4 , and after performing a corresponding test on the image, the test result is output to the database 3 through the connection 5 for storage. The connection 5 is a database connection, such as an open database connection (Open Database Connectivity, ODBC), or a Java database connection (Java Database Connectivity, JDBC).

[0017] In this embodiment, the image sensing chip 10 to be tested is accommodated in a camera module 1 , u...

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Abstract

The invention provides an image sensing wafer stain detection system, comprising an initialization setting module which is used for initially setting a quasi-stain standard value range and a stain standard value, an image acquiring module which is used for acquiring the brightness value of each pixel in the acquired image, a calculating module which is used for calculating the average value of the difference value of the brightness for each pixel and peripheral each pixel, and calculating a standard difference value of the brightness for each pixel and peripheral each pixel; a comparison module which is used for comparing the average and the standard difference value with the quasi-stain standard value range and the stain standard value respectively, and a labeling module which is used for labeling the quasi-stain in the quasi-stain standard value range and the stains exceeding the stain standard value range. The image sensing wafer stain detection system avoids the problems of subjective factors and residual error rate by manpower eye detection, and improves the detection qualification rate. The invention also provides a detection method for the image sensing wafer stain detection system.

Description

technical field [0001] The present invention relates to a system for detecting the quality of an image sensing wafer, in particular to an image sensing wafer stain detection system and a detection method for detecting stains on the surface of the image sensing wafer. Background technique [0002] With the continuous development of science and technology, portable electronic devices such as mobile phones are widely used and tend to be light, beautiful and multi-functional. The camera function is an additional function of the popular mobile phones in recent years. A digital camera module used in a mobile phone must not only meet the requirements of thinness, lightness and compactness, but also have high photographic performance. However, as the pixels of the camera modules of digital cameras and mobile phones continue to increase, the imaging area of ​​the image sensing chip continues to shrink, which makes the single pixels more and more dense and smaller, so that even fine d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/958
CPCG01N2021/8887H04N17/002G01N21/94
Inventor 彭磊王江平
Owner FOSHAN PREMIER SCI & TECH CO LTD
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