Monte Carlo random signal generating apparatus of single particle fault injection analog

Abstract

The invention provides a Monte Carlo random signal generating device with single particle fault injection simulation. The device comprises a main control computer consisting of a space particle Monte Carlo matching module, a node capacitance estimation module and a single particle range estimation module, and a simulation card consisting of a synchronous circuit, a serial port data conversion circuit, an FLASH memory, an FLASH read-write control module, an incident angle selection module, a space particle selection module, a circuit node selection module and a fault control signal generation module. The device is mainly used to test the capability of a semiconductor device for resisting the space single particle effect. The device has the advantages of simulating real space environment, making the simulation results more close to the real environment, and improving the accuracy of the single particle fault injection simulation.

Description

technical field [0001] The invention relates to a Monte Carlo random signal generating device for single-event fault injection simulation, which is mainly used in the verification of the ability of semiconductor devices to resist space single-event effects. Background technique [0002] When a digital circuit is applied in a space environment, space high-energy particles will penetrate the interior of the semiconductor device and generate ionization on the path, and the circuit nodes will absorb the electrons and holes generated by the ionization, resulting in circuit errors. This effect is called single event effect . There are mainly radiation experiment methods and simulation methods for simulating single event effects on the ground. The radiation experiment method is expensive and the cycle is long, and the simulation method is low-cost and easy to implement. It has become an urgent research method for verifying the resistance of circuits against single events. [0003]...

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Problems solved by technology

[0005] To sum up, the existing fault injection methods are used to verify the anti-single event effect of large-scale target circuits, and adopt simple uniform triggering or traversal node triggering in the way of triggering fault injection, without considering the particularity of the space environment and the circuit Due to its own electrical characteristics, it is difficult to get close to the physical process of single event effects in real space, resulting in large errors between fault injection simulation results and irradiation experiments. Therefore, in order to obtain ideal simulation results, a single event effect close to real space is needed. Fault control signal generation method to trigger fault injection

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