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Control device

A control device and wiring technology, which can be used in measurement devices, printed circuit manufacturing, instruments, etc., and can solve the problems of complicated circuits and increased space.

Active Publication Date: 2009-11-04
HITACHI LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] In addition, in the prior art, in order to evaluate corrosion damage, in addition to the wiring for ion migration measurement, it is necessary to install wiring for corrosion measurement and an aging detection circuit, so that the existing circuit becomes more complicated and occupies space increase etc.

Method used

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Effect test

Embodiment 1

[0057] figure 1 It is a block diagram of a degradation detection device for a printed circuit board according to the first embodiment of the present invention. On the printed circuit board 1 , in addition to the original wiring, there are also aging detection wirings 2 at intervals greater than or equal to the minimum wiring interval of the printed circuit board. That is, the aging detection wiring can be manufactured by the same process as that of the conventional wiring. Here, the scope of the printed substrate 1, except in Figure 5 In addition to the MPU substrate 22, I / O substrate 23, main circuit substrate 24 and automatic remote diagnosis device substrate 25 described in , it also includes all printed substrates used in elevators.

[0058] To the aging detection wiring 2 of the printed circuit board, there are connected an aging judging circuit 3 for detecting whether or not the insulation resistance of the wiring has decreased, an integrating circuit 4 for integratin...

Embodiment 2

[0072] Figure 7 It is a block diagram of the degradation detection device of the printed circuit board in 2nd Embodiment of this invention. The second embodiment is characterized in that a deterioration judgment circuit 3 for detecting whether the insulation resistance has decreased, an integration circuit 4, and an abnormal signal generation circuit 2 are connected to the deterioration detection wiring 2 at a distance greater than or equal to the minimum insulation distance of the printed circuit board. 5 circuits, and each circuit is composed of more than two systems. Different insulation resistance thresholds are set in the aging judging circuit 3 for detecting whether the insulation resistance has decreased. For example, by setting the 1st threshold to 10 8 Ω, set the second threshold to 10 7 Ω, to judge the degree of signs of ion migration or corrosion, and to judge the risk of functional damage. In addition, by adding a circuit that can shorten the measurement time,...

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PUM

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Abstract

The present invention provides a control device. A problem that a break circuit caused due to ion migration and a breakwire caused due to corrosion may not be detected in advance exists, so as to implement a posterior maintenance due to undetected condition. The control device with a printing substrate is provided with wirings for aging detection, a distance between two neighboring wirings is more than or equal to a minimum wiring distance of the printing substrate; a voltage apply circuit, for applying a prescribed voltage between the wirings; an aging judge circuit, connected with the wirings for detecting whether an insulating resistance is reduced or not; a reckoning circuit, for reckoning signals obtained by the above detection; and an abnormal signal generating circuit, for generating an abnormal signal according to a reckoning number of the reckoning circuit.

Description

technical field [0001] The present invention relates to a printed circuit board of a control device, and to a method of constituting a printed circuit board capable of detecting signs such as ion migration and corrosion that cause damage before its function is damaged. Background technique [0002] As a method of detecting aging before the functional damage of the printed circuit board, such as Japanese Patent Application Laid-Open No. 2004-179456, Japanese Patent Laid-Open No. 2001-358429, and Japanese Patent Laid-Open No. Hei 5-129738 are known. methods in which, by providing wirings with narrower insulation intervals than standard wirings, wirings with narrower widths, or wirings with thinner resist films, etc., which are prone to ion migration and corrosion, etc., The aging is detected by causing ion migration, corrosion, and the like to occur in the wiring. In addition, as a method for detecting the deterioration, methods disclosed in Japanese Patent Laid-Open No. 2004...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/02H05K1/02H05K3/00
Inventor 南谷林太郎大贯朗松井孝行
Owner HITACHI LTD
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