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GIS space superposition analysis method

A superimposed analysis and spatial technology, applied in the field of GIS, can solve the problems of huge coding and unfavorable computers.

Active Publication Date: 2010-01-27
INST OF COMPUTING TECH CHINESE ACAD OF SCI
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Problems solved by technology

[0006] The purpose of the present invention is to overcome the shortcomings of the existing superposition analysis method, which is caused by the independent superposition of point-plane, line-plane and plane-plane, which is huge and unfavorable for computer implementation, so as to provide a one-time algorithm with scan line algorithm as the core. Scan-and-done overlay analysis method

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  • GIS space superposition analysis method

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Embodiment Construction

[0069] In the process of line-surface superposition and surface-surface superposition of spatial superposition analysis, the calculation of intersection points between line segments is based on the calculation of the intersection point between line segments. Transformed into an intersection point problem. Based on the above-mentioned characteristics of the three superposition processes, the present invention proposes a superposition analysis method with intersection point calculation as the core. In this method, based on the scanning line algorithm in the ray method, the intersection point is calculated and the intersection point information is recorded during the scanning process, and then passed The intersection point information gets the final superposition result.

[0070] Refer below figure 1 , the spatial overlay analysis method of the present invention will be described.

[0071] Step 1), read the data related to the spatial overlay analysis, that is, read the data of...

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Abstract

The invention provides a GIS space superposition analysis method, which comprises the following steps: reading the data of a layer requiring space superposition, and initializing the direction of surface data in the layer; separating the objects to be superposed in the data according to superposition types, and then converting the objects to be superposed into line segments; adopting a scan line algorithm to calculate the superposed objects which are converted into the line segments so as to obtain and record intersection point information; combining the intersection point information to perform geometric calculation on the objects to be superposed according to the superposition types of the data; and for the geometric calculation result, carrying on correlative attributes from corresponding element data in the layer according to the ID information in the geometric calculation result so as to obtain the final superposition analysis result. The method adopts the scan line algorithm when solving intersection points so that all the intersection points can be solved in one operation, and any one polygonous line segment only needs initialization once to obtain all the intersection points generated by the line segment.

Description

technical field [0001] The present invention relates to a GIS (Geographical Information System, geographic information system), in particular to a spatial overlay analysis method in the GIS. Background technique [0002] Geographic Information System (GIS) is a very important spatial information system. It is a technical system that collects, stores, manages, calculates, analyzes, displays and describes the relevant geographical distribution data in the entire or part of the earth's surface (including the atmosphere) space with the support of computer software and hardware systems. Spatial analysis is an important part of GIS, the soul of GIS, and one of the main indicators for evaluating a GIS function. Spatial analysis is a spatial data analysis technology based on the location and morphological characteristics of geographical objects. Its purpose is to extract and discover hidden spatial information and laws. It is one of the basic methods of spatial data mining and know...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30
Inventor 赵红超闫杰申排伟程振林
Owner INST OF COMPUTING TECH CHINESE ACAD OF SCI