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Method and device thereof for measuring storage device

A storage device and processing device technology, applied in static memory, instruments, etc., can solve the problems of poor memory durability and impact, and achieve the effect of efficient testing

Active Publication Date: 2010-06-30
SILICON MOTION INC (CN) +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this kind of method often needs to write a large number of test strings into the storage device to be tested, so the actions of reading and writing will be repeated continuously, which is not only time-consuming, but also has the number of times of writing and reading in the memory. There is a limit on the number of times on the upper itself, so it has a bad impact on the durability of the memory

Method used

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  • Method and device thereof for measuring storage device
  • Method and device thereof for measuring storage device
  • Method and device thereof for measuring storage device

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Embodiment Construction

[0016] Certain terms are used in this application to refer to particular components. It should be understood by those skilled in the art that hardware manufacturers may refer to the same component by different terms. In this application, the difference in name is not used as a way to distinguish components, but the difference in function of components is used as a criterion for distinguishing. The "comprising" mentioned in this application is an open term, so it should be interpreted as "including but not limited to". In addition, the term "coupled" here includes any direct and indirect means of electrical connection. Therefore, if it is described that a first device is coupled to a second device, it means that the first device can be directly electrically connected to the second device, or indirectly electrically connected to the second device through other devices or connection means. .

[0017] figure 1 A testing system 100 for testing a storage device according to an e...

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Abstract

The invention discloses a method for measuring a storage device, which comprises the following steps of: (a) writing a special test character string (pattern) in a storage unit of a storage device; (b) reading the special test character string written in the storage unit; (c) judging one error bit of the read special test character string; and (d) if the error bit is larger than an error bit critical value, judging that the storage unit is damaged, wherein the error bit critical value is smaller than one correctable bit of one error correction code corresponding to the special test character string.

Description

technical field [0001] The present invention relates to a method and a system for testing a storage device, in particular to a method and a system for testing a storage device that first roughly tests whether the storage device is defective, and then tests whether the storage device is defective in certain characteristics. Background technique [0002] Generally, when testing storage devices such as memory, a large number of test strings (patterns) are written into the storage device to be tested, and then the written test strings are read out one by one and a standard write result comparison to determine whether the storage device is defective. However, this kind of method often needs to write a large number of test strings into the storage device to be tested, so the actions of reading and writing will be repeated continuously, which is not only time-consuming, but also has the number of times of writing and reading in the memory. There is a limit on the number of times o...

Claims

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Application Information

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IPC IPC(8): G11C29/04
Inventor 曾文武
Owner SILICON MOTION INC (CN)
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